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Supporting Information File 1: Simulated tip–sample force interactions. | ||
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Cite the Following Article
Design of V-shaped cantilevers for enhanced multifrequency AFM measurements
Mehrnoosh Damircheli and Babak Eslami
Beilstein J. Nanotechnol. 2020, 11, 1525–1541.
https://doi.org/10.3762/bjnano.11.135
How to Cite
Damircheli, M.; Eslami, B. Beilstein J. Nanotechnol. 2020, 11, 1525–1541. doi:10.3762/bjnano.11.135
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