Polynomial force approximations and multifrequency atomic force microscopy

Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland
Beilstein J. Nanotechnol. 2013, 4, 352–360. https://doi.org/10.3762/bjnano.4.41

Supporting Information

Supporting Information File 1: A movie showing the tip motion and the reconstructed tip–surface during an ImAFM approach measurement.
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Polynomial force approximations and multifrequency atomic force microscopy
Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland
Beilstein J. Nanotechnol. 2013, 4, 352–360. https://doi.org/10.3762/bjnano.4.41

How to Cite

Platz, D.; Forchheimer, D.; Tholén, E. A.; Haviland, D. B. Beilstein J. Nanotechnol. 2013, 4, 352–360. doi:10.3762/bjnano.4.41

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