Measurement of polarization effects in dual-phase ceria-based oxygen permeation membranes using Kelvin probe force microscopy

• Kerstin Neuhaus,
• Christina Schmidt,
• Liudmila Fischer,
• Wilhelm Albert Meulenberg,
• Ke Ran,
• Joachim Mayer and
• Stefan Baumann

Beilstein J. Nanotechnol. 2021, 12, 1380–1391, doi:10.3762/bjnano.12.102

• and cleaning were performed with an Ar ion beam in a Fischione Nanomill 1040 at 900 eV and 500 eV beam energy, respectively. TEM and energy-filtered TEM (EFTEM) imaging were performed with a FEI Tecnai F20 at 200 kV. High-resolution HAADF imaging and energy-dispersive X-ray (EDX) chemical mapping were

• conducted with a FEI Titan G2 80-200 ChemiSTEM microscope equipped with an XFEG, a probe Cs corrector and a super-X EDXS system. Results and Discussion Electron microscopy A representative grain and phase distribution image of the sample is shown in Figure 1. The EFTEM image in Figure 1b clearly shows two

• electrochemical experiments or KPFM imaging. Additionally, temperature-dependent measurements of the polarization–relaxation behavior are planned. TEM image (a) and the corresponding energy-filtered TEM (EFTEM) image (b) showing the grain size and phase distribution inside 60CSO20-FC2O (red: Ce and thus

Scanning transmission helium ion microscopy on carbon nanomembranes

• Daniel Emmrich,
• Annalena Wolff,
• Nikolaus Meyerbröker,
• Jörg K. N. Lindner,
• André Beyer and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 222–231, doi:10.3762/bjnano.12.18

• microscopy (EFTEM) data, both being established techniques for the thickness measurement of thin films. All three presented methods, STIM, XPS, and EFTEM, require an assumption about density and composition of the material in order to calculate absolute thicknesses, so graphite was chosen as a well

• Turchanin et al. [27]. In order to provide comparability of the results to STIM and EFTEM, the attenuation length was assumed to be 27 Å, the same as that of graphite [28]. The XPS results yield values of 2.1 nm for the thin CNM and 12.4 nm for the thick CNM. Both values are in good agreement with 2.2 nm

• and 12.0 nm measured by STIM (Table 1). As a second method for comparison, EFTEM was performed on the samples after STIM measurements. EFTEM enables thickness mapping with a high lateral resolution. In EFTEM, elastically scattered electrons in a zero-loss energy-filtered image are compared to the

Silver-decorated gel-shell nanobeads: physicochemical characterization and evaluation of antibacterial properties

• Marta Bartel,
• Katarzyna Markowska,
• Marcin Strawski,
• Krystyna Wolska and
• Maciej Mazur

Beilstein J. Nanotechnol. 2020, 11, 620–630, doi:10.3762/bjnano.11.49

• ) analysis were performed with a Zeiss Merlin field-emission SEM instrument. Transmission electron microscopy images were collected with a Zeiss Libra 120 EFTEM. Confocal laser scanning microscopy (CLSM) imaging of bacterial biofilms was performed with a Nikon AIR MP microscope equipped with a 60×, NA 1.4

Site-controlled formation of single Si nanocrystals in a buried SiO₂ matrix using ion beam mixing

• Xiaomo Xu,
• Thomas Prüfer,
• Daniel Wolf,
• Hans-Jürgen Engelmann,
• Lothar Bischoff,
• René Hübner,
• Karl-Heinz Heinig,
• Wolfhard Möller,
• Stefan Facsko,
• Johannes von Borany and
• Gregor Hlawacek

Beilstein J. Nanotechnol. 2018, 9, 2883–2892, doi:10.3762/bjnano.9.267

• electron microscopy (TEM) lamella preparation. In all cases, the local distribution and size of the NCs are mapped using energy-filtered transmission electron microscopy (EFTEM). Results and Discussion In Figure 1, a comparison of cross-sectional Si plasmon-loss-filtered TEM images obtained from two Si

• – measured using the inelastic mean free path of the electron [25] – we estimate an average distance between the NCs of approximately 12 nm. Please note that the EFTEM image shows a projection of the NCs. Therefore, the estimated NC separation in the 2D layer is larger than the visually observed distance in

• the cross sectional EFTEM image. A combination of the binary collision approximation (BCA) method using TRIDYN [26] and kMC simulations [27] was used to gain atomistic insight into the observed NC formation and its dependence on the layer thicknesses, the irradiation conditions and the thermal

Magnetic characterization of cobalt nanowires and square nanorings fabricated by focused electron beam induced deposition

• Federico Venturi,
• Gian Carlo Gazzadi,
• Amir H. Tavabi,
• Alberto Rota,
• Rafal E. Dunin-Borkowski and
• Stefano Frabboni

Beilstein J. Nanotechnol. 2018, 9, 1040–1049, doi:10.3762/bjnano.9.97

• in width and with deposition times that varied between 10 and 60 s in 10 s steps. For each deposition time, the deposited thickness was found to be similar in each set, as revealed by energy-filtered TEM (EFTEM) thickness maps [32]. The material deposited at 5 keV had a width that was much larger

• -sectional areas measured from EFTEM thickness maps. The measured magnetic induction as a function of the deposition time is shown in Figure 1c. For the same deposition time, is higher for depositions at 5 keV. There is also an increasing trend with increasing deposition time, which tends to saturate at 50

Self-assembly of silicon nanowires studied by advanced transmission electron microscopy

• Marta Agati,
• Guillaume Amiard,
• Vincent Le Borgne,
• Paola Castrucci,
• Richard Dolbec,
• Maurizio De Crescenzi,
• My Alì El Khakani and
• Simona Boninelli

Beilstein J. Nanotechnol. 2017, 8, 440–445, doi:10.3762/bjnano.8.47

• ) spectroscopy, it is possible to gather both imaging and analytical information at the same time. In the present work, ET combined with STEM-EDX and energy-filtered TEM (EFTEM) enabled the structural characteristics of SiNWs spontaneously assembled during an inductively coupled plasma (ICP) process to be

• or located at the tip. To unequivocally resolve this point, 3D STEM tomography characterization at the nanoscale was employed. Finally, the metallic composition of such nanoparticles was ascertained via the synergetic use of EFTEM and STEM-EDX. The ensemble of our results suggests that the vapor

• . Energy-filtered TEM (EFTEM) images, acquired in correspondence to the Si plasmon loss (17 eV) and SiO2 plasmon loss (23 eV), display a common core–shell Si–SiO2 internal structure for both the NSs and the NWs (see Figure 1b and Figure 1c). Further EFTEM investigations conducted on hundreds of NWs

Nanoanalytics for materials science

• Thilo Glatzel and
• Tom Wirtz

Beilstein J. Nanotechnol. 2016, 7, 1674–1675, doi:10.3762/bjnano.7.159

• applied to investigate magnetite nanoparticles by Kalska-Szostka et al. [4]. TEM was also used in the work of Gutsch et al. who developed a novel energy-filtered transmission electron microscopy (EFTEM) approach using ultrathin TEM membranes [5]. With this method, they were able to accurately study the

Reconstitution of the membrane protein OmpF into biomimetic block copolymer–phospholipid hybrid membranes

• Matthias Bieligmeyer,
• Franjo Artukovic,
• Stephan Nussberger,
• Thomas Hirth,
• Thomas Schiestel and
• Michaela Müller

Beilstein J. Nanotechnol. 2016, 7, 881–892, doi:10.3762/bjnano.7.80

• EFTEM (Zeiss, Oberkochen, Germany) operated at 200 kV. Block copolymer–phospholipid mixtures Mixtures of block copolymers and phospholipids (molar ratio 9:1) were prepared by combining 200 µL of block copolymer solutions (10 mg mL−1 in THF) with solutions (2 mg mL−1 in chloroform) of a mixture (97.5:2.5

Magnetic properties of iron cluster/chromium matrix nanocomposites

• Arne Fischer,
• Robert Kruk,
• Di Wang and
• Horst Hahn

Beilstein J. Nanotechnol. 2015, 6, 1158–1163, doi:10.3762/bjnano.6.117

• energy-filtered transmission electron microscopy (EFTEM) and scanning transmission electron microscopy (STEM) micrographs of the Fe distribution for a 10 vol % Fe1000/Cr sample, specifically prepared for TEM. To avoid subsequent focused ion beam cutting and possible oxidation, the sample was deposited on

• EFTEM micrograph clearly shows that the Fe clusters are evenly distributed in the matrix and no significant agglomeration occurs. In the STEM image individual Fe clusters are clearly visible. Their size can be estimated to be roughly 3 nm which matches the expected 2.8 nm. Additional diffraction data

• layers of the AFM Cr surrounding the FM Fe cluster. EFTEM (left) and STEM (right) micrographs of a 10 vol % Fe1000/Cr sample prepared on a TEM grid + amorphous carbon film with an Fe cluster equivalent thickness of 0.2 nm. The EFTEM image shows the Fe cluster distribution in the sample and the STEM image

Observing the morphology of single-layered embedded silicon nanocrystals by using temperature-stable TEM membranes

• Sebastian Gutsch,
• Daniel Hiller,
• Jan Laube,
• Margit Zacharias and
• Christian Kübel

Beilstein J. Nanotechnol. 2015, 6, 964–970, doi:10.3762/bjnano.6.99

• -plane energy-filtered TEM (EFTEM) as was demonstrated for Si NCs formed by low energy Si ion implantation [10][26], plasma-enhanced chemical vapor deposition (PE-CVD) [27] or evaporation [28] followed by a high temperature annealing. The bottleneck in such measurements is the low TEM plane view specimen

• preparation yield when ultrathin layers are concerned. We circumvent this issue in this work by using nanometer thin, free standing silicon nitride membranes to allow for plane view EFTEM analysis without further sample preparation. Thin layers of Si-rich silicon oxynitride (SRON) can be deposited directly on

• . Here, we investigate ultrathin SRON layers by using plane view EFTEM and discuss possible pitfalls in both sample preparation and TEM imaging. Finally, we demonstrate how the thickness and stoichiometry of a SRON layer affects the Si NC size distribution, shape and areal density. Experimental We used 5

Template-directed synthesis and characterization of microstructured ceramic Ce/ZrO₂@SiO₂ composite tubes

• Jörg J. Schneider and
• Meike Naumann

Beilstein J. Nanotechnol. 2014, 5, 1152–1159, doi:10.3762/bjnano.5.126

• together. The composition and crystallinity of this material connecting the individual silica particles contains the elements Ce and Zr and O as mixed oxide solid solution identified by XRD, Raman and high-resolution TEM and EFTEM. High-resolution microscopy techniques allowed for an elemental mapping on

• the composite tubes Ce0.13/Zr0.87O2@SiO2 as the tetragonal cubic structure of ZrO2. EFTEM investigations on the CeO2/ZrO2@SiO2 microtubes material were performed in order to investigate the homogeneity of the Zr/Ce impregnation after final calcination as well as to gather information about the overall

• zirconium are found on the surface of the spherical Stoeber particles, which indicates that, primarily, the intersticial volume between the silica particles is filled (see Figure 3 TEM and Figure 6 EFTEM). This fact becomes especially obvious when comparing the EFTEM Zr- and O-maps (Figure 6c,d). In order

Enhanced photocatalytic activity of Ag–ZnO hybrid plasmonic nanostructures prepared by a facile wet chemical method

• Sini Kuriakose,
• Vandana Choudhary,
• Biswarup Satpati and
• Satyabrata Mohapatra

Beilstein J. Nanotechnol. 2014, 5, 639–650, doi:10.3762/bjnano.5.75

• mapping using EFTEM for obtaining the distributions of Zn, O and Ag atoms in the Ag–ZnO hybrid nanostructures. Chemical maps from Zn M (87 eV), O K (532 eV) and Ag N (56 eV) edges were obtained using the jump-ratio method by acquiring two images (one post-edge and one pre-edge), respectively, to extract

• the background, with an energy slit of 8 eV for Zn, 30 eV for O and 2 eV for Ag. The observed EFTEM images confirmed the decoration of ZnO nanostructures with Ag nanoparticles. Optical absorption and photoluminescence The UV–visible absorption spectra of samples with varying Ag concentration are shown

• same area of the TEM image. (d) EDX line profile from a region marked by line in (c) showing the distribution of different constituent elements across the nanostructures. EFTEM images taken from the same area of a TEM image indicating the locations of different atoms across the nanostructure in sample

Nano-structuring, surface and bulk modification with a focused helium ion beam

• Daniel Fox,
• Yanhui Chen,
• Colm C. Faulkner and
• Hongzhou Zhang

Beilstein J. Nanotechnol. 2012, 3, 579–585, doi:10.3762/bjnano.3.67

• cross section allowing direct observation of the extended effects of high dose irradiation. The effect of the irradiation on the crystal structure of the material is presented. Applications of the sample modification process are presented and further prospects discussed. Keywords: EELS; EFTEM; helium

• surface and structure using advanced transmission electron microscopy (TEM) techniques such as energy filtered TEM (EFTEM) and electron energy loss spectroscopy (EELS). We also present the limitations of this surface modification technique. Results and Discussion Sample 1 is a silicon lamella shown after

• extends further from the top of the sample in the modified region, this results in a larger area useable for TEM in samples modified by the HIM. Figure 1e shows the EFTEM gallium map of the region. The areas of higher intensity in this map have a greater concentration of gallium contamination. The solid