Quantitative wear evaluation of tips based on sharp structures

• Ke Xu and
• Houwen Leng

Beilstein J. Nanotechnol. 2024, 15, 230–241, doi:10.3762/bjnano.15.22

• simulate the characteristics of a sharp tip, the tapping mode scanning process of an AFM scanning a hard sample in air was simulated in MATLAB. The method of dilation from mathematical morphology was used to simulate the image based on the morphology of the tip and the sample [21]. The convolution effect

A combined gas-phase dissociative ionization, dissociative electron attachment and deposition study on the potential FEBID precursor [Au(CH₃)₂Cl]₂

• Elif Bilgilisoy,
• Ali Kamali,
• Thomas Xaver Gentner,
• Gerd Ballmann,
• Sjoerd Harder,
• Hans-Peter Steinrück,
• Hubertus Marbach and
• Oddur Ingólfsson

Beilstein J. Nanotechnol. 2023, 14, 1178–1199, doi:10.3762/bjnano.14.98

• hydrochloric acid and/or chloromethane plays an important role in these fragmentation processes. In FEBID, the effective damage yield [28][49] for a specific precursor will be a convolution of the energy distribution of the electrons involved (i.e., of the primary, secondary, and inelastic scattered electrons

On the use of Raman spectroscopy to characterize mass-produced graphene nanoplatelets

• Keith R. Paton,
• Konstantinos Despotelis,
• Naresh Kumar,
• Piers Turner and
• Andrew J. Pollard

Beilstein J. Nanotechnol. 2023, 14, 509–521, doi:10.3762/bjnano.14.42

• (relative) intensity and larger width than for single-layer graphene as a result of the convolution of many individual peaks [13]. It has previously been shown that Raman spectroscopy can be used to provide quantitative information on both flake thickness and lateral size of exfoliated graphene

Spin dynamics in superconductor/ferromagnetic insulator hybrid structures with precessing magnetization

• Yaroslav V. Turkin and
• Nataliya Pugach

Beilstein J. Nanotechnol. 2023, 14, 233–239, doi:10.3762/bjnano.14.22

• superconducting condensate in the weak proximity effect regime can be described via the nonstationary Usadel equation [18][19][30]: where is the stationary BCS superconducting order parameter matrix [28], D is the diffusion constant, is the auxiliary matrix in Nambu–spin-Keldysh space, is the time convolution

• noticed that a fraction of the spin distribution is lying inside the gap and should not be taken into account. But in the time-dependent case, there is always an energy shift equal to ±ℏΩ/2. This energy shift appears in every time convolution. The real consequences of these undergap states may be found if

Effects of focused electron beam irradiation parameters on direct nanostructure formation on Ag surfaces

• Jānis Sniķeris,
• Vjačeslavs Gerbreders,
• Andrejs Bulanovs and
• Ēriks Sļedevskis

Beilstein J. Nanotechnol. 2022, 13, 1004–1010, doi:10.3762/bjnano.13.87

• the ones measured by AFM due to the tip convolution effect [37]; however, this should not affect the displayed trends. The results presented in Figure 3 show that the height of the nanostructures on the Ag surface could be increased by elevating the EB focus by a few microns above the surface during

Theoretical investigations of oxygen vacancy effects in nickel-doped zirconia from ab initio XANES spectroscopy at the oxygen K-edge

• Dick Hartmann Douma,
• Lodvert Tchibota Poaty,
• Alessio Lamperti,
• Stéphane Kenmoe,
• Abdulrafiu Tunde Raji,
• Alberto Debernardi and
• Bernard M’Passi-Mabiala

Beilstein J. Nanotechnol. 2022, 13, 975–985, doi:10.3762/bjnano.13.85

• has been used for the similar SiO2 and has been found to produce theoretical spectra that are consistent with experimental data [45]. Also, a Lorentzian convolution with a variable broadening parameter γ has been applied in the continued fraction. For this purpose, we used γ = 0.3 eV for photon

Quantitative dynamic force microscopy with inclined tip oscillation

• Philipp Rahe,
• Daniel Heile,
• Reinhard Olbrich and
• Michael Reichling

Beilstein J. Nanotechnol. 2022, 13, 610–619, doi:10.3762/bjnano.13.53

• has been applied. Additionally, a tilted cantilever has been found to lead to a modification of the tip–sample convolution [12], to enhance the sensitivity of the measurement to the probe side [13], and to influence results of multifrequency AFM and Kelvin probe force microscopy [14]. In the presence

• -dependent shift in frequency, Δf(zp), of the sensor excitation frequency fexc that results when phase resonance for the sensor oscillation is maintained throughout the measurement [19]. The resulting curve Δf(zp) is a convolution of the covered part of the force curve and a kernel depending on the

Topographic signatures and manipulations of Fe atoms, CO molecules and NaCl islands on superconducting Pb(111)

• Carl Drechsel,
• Philipp D’Astolfo,
• Jung-Ching Liu,
• Thilo Glatzel,
• Rémy Pawlak and
• Ernst Meyer

Beilstein J. Nanotechnol. 2022, 13, 1–9, doi:10.3762/bjnano.13.1

• between maxima (Figure 2c), corresponding to the distance of aPb = 4.95 Å between two Pb(110) rows (dashed lines in Figure 2b). In agreement with [57], the additional length of ≈2 Å might be related to the tilting of the adsorbed CO molecules under the scanning tip as well as the tip convolution during

Irradiation-driven molecular dynamics simulation of the FEBID process for Pt(PF₃)₄

• Alexey Prosvetov,
• Alexey V. Verkhovtsev,
• Gennady Sushko and
• Andrey V. Solov’yov

Beilstein J. Nanotechnol. 2021, 12, 1151–1172, doi:10.3762/bjnano.12.86

• distribution of secondary (SE) and backscattered (BSE) electrons produced due to the collision of the PE beam with the substrate. The convolution of the SE and BSE flux density with the fragmentation cross section of the precursor molecule determines the fragmentation probability of precursors at any space

A new method for obtaining model-free viscoelastic material properties from atomic force microscopy experiments using discrete integral transform techniques

• Berkin Uluutku,
• Enrique A. López-Guerra and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2021, 12, 1063–1077, doi:10.3762/bjnano.12.79

• functions). More specifically, the stress at a given instant depends on the total previous history of strain and vice versa [13]. This history dependence is often expressed in the form of convolution integrals: where Q(t) and U(t) are known as relaxance and retardance, respectively. As already stated

• in the time convolution of Equation 11 and simplifying, we obtain the equation we have previously used as the basis for extracting the viscoelastic model parameters and corresponding properties using non-linear least-squares optimization in our previous work: An alternate strategy is to turn to the

• convolutions presented in Equation 1 and Equation 2: where N corresponds to the number of points in the signal. As previously done for writing Equation 3 and Equation 4, we make use of the convolution properties of the Z-transform, which are similar to those of the Laplace transform, to obtain: where all of

The role of convolutional neural networks in scanning probe microscopy: a review

• Ido Azuri,
• Irit Rosenhek-Goldian,
• Neta Regev-Rudzki,
• Georg Fantner and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2021, 12, 878–901, doi:10.3762/bjnano.12.66

• the features that best differentiate between images from different categories. Dimensions of the filters for 2D convolution typically have dimensions of 3 × 3, 5 × 5, and 7 × 7. Activation layer An activation is usually applied on the feature maps to give “activated” feature maps. This is typically a

• while keeping the most important information of the features. Usually, a window of size 2 × 2 (for 2D convolution) slides on a feature map in strides of 2 × 2 and the maximum value within the 2 × 2 pooling window is returned. This kind of pooling is called “Max pooling”. The convolutional, activation

Reducing molecular simulation time for AFM images based on super-resolution methods

• Zhipeng Dou,
• Jianqiang Qian,
• Yingzi Li,
• Rui Lin,
• Jianhai Wang,
• Peng Cheng and
• Zeyu Xu

Beilstein J. Nanotechnol. 2021, 12, 775–785, doi:10.3762/bjnano.12.61

• convolution. After that, the high-dimensional vectors are nonlinearly mapped to each other and comprise another set of feature maps. Finally, they are aggregated into patches to obtain a reconstructed high-resolution image. A SRCNN is constructed to obtain a super-resolution image from a low-resolution

• first layer is operated to extract the image feature of X as an operation F1: where W1 represents 64 types of convolution kernels with the size of 9 × 9, and B1 represents the biases. The first layer extracts a 64-dimensional feature for each patch. Furthermore, the non-linear mapping is on a 5 × 5

• “patch” of the feature map as follows: where W2 and B2 represent 32 types of convolution kernels with the size of 5 × 5 and the biases, respectively. The final super-resolution image is generated with the reconstruction layer as follows: where W3 and B3 represent a linear filter with the size of 5 × 5

High-yield synthesis of silver nanowires for transparent conducting PET films

• Gul Naz,
• Hafsa Asghar,
• Muhammad Ramzan,
• Muhammad Arshad,
• Rashid Ahmed,
• Muhammad Bilal Tahir,
• Bakhtiar Ul Haq,
• Nadeem Baig and
• Junaid Jalil

Beilstein J. Nanotechnol. 2021, 12, 624–632, doi:10.3762/bjnano.12.51

• the actual solution colors. (b) XRD pattern of the as-synthesized AgNWs sample. (c) PL emission spectrum of AgNWs falling in the range of 600–800 nm with red emission. The de-convolution into Lorentzian peaks yields peaks at 607, 657, and 718 nm. The red dashed curve is the fit sum of all three

TiO_x/Pt₃Ti(111) surface-directed formation of electronically responsive supramolecular assemblies of tungsten oxide clusters

• Marco Moors,
• Yun An,
• Agnieszka Kuc and
• Kirill Yu. Monakhov

Beilstein J. Nanotechnol. 2021, 12, 203–212, doi:10.3762/bjnano.12.16

• and 900 K. It should be remarked that, although the height information in STM images is always a convolution of electronic and topographic surface properties, their origin in this case is expected to be strongly dominated by the surface morphology. This is due to the formation of compact oxide island

Free and partially encapsulated manganese ferrite nanoparticles in multiwall carbon nanotubes

• Saja Al-Khabouri,
• Salim Al-Harthi,
• Toru Maekawa,
• Mohamed E. Elzain,
• Ashraf Al-Hinai,
• Ahmed D. Al-Rawas,
• Abbsher M. Gismelseed,
• Ali A. Yousif and
• Myo Tay Zar Myint

Beilstein J. Nanotechnol. 2020, 11, 1891–1904, doi:10.3762/bjnano.11.170

• (Figure 6) correspond to the convolution of the π band of MWCNTs and the Mn 3d electrons emitted from MnFe2O4, respectively. In addition, the formation of MnFe2O4/MWCNTs causes an enhancement in the DOS at the Fermi level, as indicated in the inset of Figure 6 [36]. Reports in the literature attributed

Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy

• Cameron H. Parvini,
• M. A. S. R. Saadi and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 922–937, doi:10.3762/bjnano.11.77

• of Equation 2, rearranging, substituting the creep compliance relationship above, and taking the inverse Laplace transform, one arrives at the following result: Equation 5 allows for the straightforward definition of the retardance U(t) according to an appropriate material model. The convolution

• thus excluded from the analysis shown here. If this term was included under special circumstances, the set of fit parameters would increase by a number determined by the steady-state flow model utilized for ϕf and an additional numerical convolution would become necessary. Equation 9 allows for

• requires a numerical convolution of U(t) and F(t) in terms of the material parameter set {Jg, Jn, τn}. Useful viscoelastic quantities When characterizing the response of viscoelastic materials to external stress, especially during cyclic loading (such as with dynamic mechanical analysis (DMA) machines), it

Light–matter interactions in two-dimensional layered WSe₂ for gauging evolution of phonon dynamics

• Avra S. Bandyopadhyay,
• Chandan Biswas and
• Anupama B. Kaul

Beilstein J. Nanotechnol. 2020, 11, 782–797, doi:10.3762/bjnano.11.63

• involves the determination of the phonon lifetime τ. The phonon lifetime τ is determined from the FWHM, i.e., phonon linewidth (Γ) of the and A1g peaks in the Raman spectra. The measured Raman linewidths are a convolution of effects of both the actual Lorentzian vibrational distribution of the phonons and

Hexagonal boron nitride: a review of the emerging material platform for single-photon sources and the spin–photon interface

• Stefania Castelletto,
• Faraz A. Inam,
• Shin-ichiro Sato and
• Alberto Boretti

Beilstein J. Nanotechnol. 2020, 11, 740–769, doi:10.3762/bjnano.11.61

• ) = < 0.5, two emitters when g(2)(0) ≈ 0.5, 3 emitters g(2)(0) ≈ 0.67, and so on. In fact, due to the photon counts background and finite response time of the correlation measurements are limited today by the convolution of the time response of the two SP detectors, g(2)(0) ≠ 0, in the case of the SP

Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

• Berkin Uluutku and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 453–465, doi:10.3762/bjnano.11.37

• look intimidating at first glance. However, we note that the infinite series in Equation 13 consist of delta functions at different frequencies, multiplied by their respective coefficients. Convolution of a given function with a delta function yields only a time shift in the convolved function, without

• that the higher harmonics of the current will approach a delta function with a coefficient equal to unity at 0 Hz, which has no effect on convolution operations: Thus, we can conclude that only the first few harmonics will contribute significantly. Intuitively, it is also expected that the higher

• harmonics should not contribute significantly to the final convolution based on their an values approaching zero with increasing n. Case 3: Dynamic intermittent-contact current measurement with realistic tip trajectory Here we consider a tip trajectory such that intermittent tip–sample repulsive contact

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

• Nahid Hosseini,
• Matthias Neuenschwander,
• Oliver Peric,
• Santiago H. Andany,
• Jonathan D. Adams and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2019, 10, 2357–2363, doi:10.3762/bjnano.10.226

• (SPM) [1]. Quality and accuracy of an AFM image strongly depend on the tip geometry since the image topography is the convolution of the surface topography and the cantilever tip geometry [2]. More precisely, the resulting images suffer from the effect of dilation [3]. AFM images with tip artefacts are

Nonlinear absorption and scattering of a single plasmonic nanostructure characterized by x-scan technique

• Tushar C. Jagadale,
• Dhanya S. Murali and
• Shi-Wei Chu

Beilstein J. Nanotechnol. 2019, 10, 2182–2191, doi:10.3762/bjnano.10.211

• low excitation intensities, when there is no nonlinear response, a Gaussian profile of the scanned image due to convolution of the laser PSF and the nanostructure is expected. However, when nonlinearity arises in the nanostructure at higher excitation intensities, the image profile is expected to

Ion mobility and material transport on KBr in air as a function of the relative humidity

• Dominik J. Kirpal,
• Korbinian Pürckhauer,
• Alfred J. Weymouth and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2019, 10, 2084–2093, doi:10.3762/bjnano.10.203

• of the tip become more important for steep edges. The depicted structures show a convolution between the tip and sample. This may result in smeared out step edges in the images and, consequently, an amplification of convex structures such as material accumulations, as well as a reduction of concave

• from this experiment. The tip–sample-convolution effect described above appears to be a dominant factor. For that reason, further experiments were performed by scratching holes into the substrate. Scratching holes at RH < 6% In this experiment the surface was exposed to very dry air below RH < 6

• significant changes over a period of some weeks. 1D schematic of the tip–sample convolution at islands and holes. Due to the tip geometry step edges appear smeared out. Consequently, accumulations appear to be larger and holes smaller. The red hatched areas show the misassigned volumes at step edges. This

Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation

• Dominik Wrana,
• Karol Cieślik,
• Wojciech Belza,
• Christian Rodenbücher,
• Krzysztof Szot and
• Franciszek Krok

Beilstein J. Nanotechnol. 2019, 10, 1596–1607, doi:10.3762/bjnano.10.155

• stability or work function on such faces, but it is justified to assume certain differences may be present between those facets, which are also influenced by the preferential removal of oxygen during thermal reduction. As TiO nanowires have a height of tens of nanometers and tip convolution may play a role

High-temperature resistive gas sensors based on ZnO/SiC nanocomposites

• Vadim B. Platonov,
• Marina N. Rumyantseva,
• Alexander S. Frolov,
• Alexey D. Yapryntsev and
• Alexander M. Gaskov

Beilstein J. Nanotechnol. 2019, 10, 1537–1547, doi:10.3762/bjnano.10.151

• convolution functions with simultaneous optimization of the background parameters. The background was simulated using a combination of a Shirley and a Tougaard background. The binding energies (BE) were corrected for the charge shift using the C 1s peak of graphitic carbon (BE = 284.8 eV) as a reference. Gas

Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology

• Loïc Crouzier,
• Alexandra Delvallée,
• Sébastien Ducourtieux,
• Laurent Devoille,
• Guillaume Noircler,
• Christian Ulysse,
• Olivier Taché,
• Elodie Barruet,
• Christophe Tromas and
• Nicolas Feltin

Beilstein J. Nanotechnol. 2019, 10, 1523–1536, doi:10.3762/bjnano.10.150

• (tapping) mode is more commonly used. It consists in oscillating the cantilever near its resonant frequency and maintaining a constant amplitude during the scan. However, regardless of the used mode, and due to tip convolution, the obtained image is a function of tip shape and tip radius (estimated to be

• can be used for an accurate determination of the NP diameter by just measuring their heights because the convolution has no effect on the measurement of the highest point of the NP [1]. In SEM, an electron beam scans the sample and several interactions can occur between the incident electrons and the

• information about the NP height, whereas the uncertainty associated with the AFM measurement of the NP maximum point is close to 1.5 nm [1]. Conversely, the lateral dimensions measured by AFM are impacted by tip/NP convolution, whereas latest-generation scanning electron microscopes equipped with field