Bulk chemical composition contrast from attractive forces in AFM force spectroscopy

• Dorothee Silbernagl,
• Media Ghasem Zadeh Khorasani,
• Natalia Cano Murillo,
• Anna Maria Elert and
• Heinz Sturm

Beilstein J. Nanotechnol. 2021, 12, 58–71, doi:10.3762/bjnano.12.5

• requirements cannot be met by most samples or most AFM setups. However, the principle idea that local attractive forces Fattr are specific for the local chemical composition and structure (as shown before by ncAFM [15][29] and NF-DAFM [30]) can also be utilized for force spectroscopy under ambient conditions

Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy

• Zahra Abooalizadeh,
• Leszek Josef Sudak and
• Philip Egberts

Beilstein J. Nanotechnol. 2019, 10, 1332–1347, doi:10.3762/bjnano.10.132

In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy

• Jesús S. Lacasa,
• Lisa Almonte and
• Jaime Colchero

Beilstein J. Nanotechnol. 2018, 9, 2925–2935, doi:10.3762/bjnano.9.271

• more detail elsewhere [42], data can be acquired in the (true) non-contact regime (nc-DAFM), where only van der Waals and electrostatic interaction is present. In this work we will assume that the tip–sample system can be described by a metallic tip interacting electrostatically with a metallic sample

• where the flat part of the cantilever chip has been analyzed in (true) nc-DAFM using Kelvin probe microscopy (KPM) to measure the contact potential. The three analyzed samples correspond to the surface of platinum-films evaporated onto silicon cantilevers, but with three different state of contamination

• the measured properties of the tip–sample system can be uniquely attributed to the sample. Experimental AFM data acquisition and processing AFM imaging Data was acquired using dynamic atomic force microscopy (DAFM) on a Nanotec Electronica AFM system with a phase-locked loop board (PLL, bandwidth ca

Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

• Mykola Telychko,
• Jan Berger,
• Zsolt Majzik,
• Pavel Jelínek and
• Martin Švec

Beilstein J. Nanotechnol. 2015, 6, 901–906, doi:10.3762/bjnano.6.93

• . For the first time we bring experimental data, that can distinguish the topographic landscape from the local electronic structure of SLG on a 6H-SiC(0001) substrate. At room temperature we employed a combined STM and dynamic atomic force microscopy (dAFM) based on the Q-plus sensor working under UHV

• graphene overgrows a step (see Figure 1c), there is no visible rippling. The set of curves in Figure 2a shows local spectroscopy taken just before the imaging above the single-layer graphene with the tuning-fork-based dAFM sensor, oscillating at amplitudes of 150 pm. The Δf, time-averaged current (

• ]. Most remarkable is the pattern (shown in the inset of Figure 3a) emerging due to the scattering at the armchair graphene boundaries. We do not observe any out-of-plane relaxation of the carbon atoms in the honeycomb structure resolved by dAFM (in the inset of Figure 3b). This is a direct evidence that

High-resolution dynamic atomic force microscopy in liquids with different feedback architectures

• John Melcher,
• David Martínez-Martín,
• Miriam Jaafar,
• Julio Gómez-Herrero and
• Arvind Raman

Beilstein J. Nanotechnol. 2013, 4, 153–163, doi:10.3762/bjnano.4.15

• Materia Condensada C-III, Universidad Autónoma de Madrid, 28049 Madrid, Spain School of Mechanical Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN 47907 10.3762/bjnano.4.15 Abstract The recent achievement of atomic resolution with dynamic atomic force microscopy (dAFM

• ) [Fukuma et al., Appl. Phys. Lett. 2005, 87, 034101], where quality factors of the oscillating probe are inherently low, challenges some accepted beliefs concerning sensitivity and resolution in dAFM imaging modes. Through analysis and experiment we study the performance metrics for high-resolution imaging

• with dAFM in liquid media with amplitude modulation (AM), frequency modulation (FM) and drive-amplitude modulation (DAM) imaging modes. We find that while the quality factors of dAFM probes may deviate by several orders of magnitude between vacuum and liquid media, their sensitivity to tip–sample

Drive-amplitude-modulation atomic force microscopy: From vacuum to liquids

• Miriam Jaafar,
• David Martínez-Martín,
• Mariano Cuenca,
• John Melcher,
• Arvind Raman and
• Julio Gómez-Herrero

Beilstein J. Nanotechnol. 2012, 3, 336–344, doi:10.3762/bjnano.3.38

• modulation; noncontact; Introduction Dynamic atomic force microscopy (dAFM) [1][2] is a powerful yet versatile tool capable of operating in environments ranging from ultrahigh vacuum (UHV) to liquids [3][4], and imaging samples ranging from stiff inorganic materials [5] to soft biological matter [6], with

• nanoscale resolution. Amplitude-modulation AFM (AM-AFM) [7] and in particular its large-amplitude version, commonly known as tapping mode [8], is the most extended dAFM mode, but it has limitations: Its application to the vacuum environment is very difficult because of the long scanning times imposed by the

• surface. The figure illustrates the monotonic tendency of this magnitude. Feedback diagrams for different d-AFM modes. dAFM has three basic variables: The oscillation amplitude A, the phase and the driving force Vexc. (a) Expansion of the feedback icon used in the schemes. (b) Typical feedback scheme for