Numerical analysis of vibration modes of a qPlus sensor with a long tip

• Kebei Chen,
• Zhenghui Liu,
• Yuchen Xie,
• Chunyu Zhang,
• Gengzhao Xu,
• Wentao Song and
• Ke Xu

Beilstein J. Nanotechnol. 2021, 12, 82–92, doi:10.3762/bjnano.12.7

• temperature range [1]. In addition, quartz tuning forks have a high elastic constant, a high quality factor (Q factor), and are self-sensing due to the piezoelectric effect [1]. Therefore, a quartz tuning fork can be used as a force sensor. The central part of the “qPlus sensor” is a quartz tuning fork of

• which one prong is fixed onto a substrate and the other prong with an attached tip serves as a self-sensing cantilever [2]. In 1996, F. J. Giessibl et al. first used the qPlus sensor to measure the morphology of a grating and a CD at room temperature [3]. Since then, this technique has been used

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

• Santiago H. Andany,
• Gregor Hlawacek,
• Stefan Hummel,
• Charlène Brillard,
• Mustafa Kangül and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111

• integration. Keywords: atomic force microscopy (AFM); combined setup; correlative microscopy; helium ion microscopy (HIM); self-sensing cantilevers; Introduction Shortly after the invention of the atomic force microscope (AFM) in 1986 [1], efforts were made towards combining this scanning probe microscopy

• correlative imaging on electrically insulating samples. In this first attempt, the readout of cantilever deflection was achieved using the electron beam itself. Shortly after, better performing combined setups were described utilizing more conventional self-sensing [5] and optical [6] techniques for the

• seamlessly between the pole piece and the sample. The assembly is made from grade-5 titanium (Ti-6Al-4V) and the three axes of motion are actuated by stack-piezo actuators, offering an achievable scan range of 30 × 30 × 12 µm. The reported AFM uses a self-sensing readout for measuring cantilever deflection

Ion mobility and material transport on KBr in air as a function of the relative humidity

• Dominik J. Kirpal,
• Korbinian Pürckhauer,
• Alfred J. Weymouth and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2019, 10, 2084–2093, doi:10.3762/bjnano.10.203

• range for each experiment. Experimental For the experiments we used a custom-designed AFM equipped with a qPlus sensor. The qPlus sensor is a stiff (k = 1800 N/m) self-sensing quartz sensor with a resonance frequency around f0 = 32 kHz. It has enabled unprecedented results in low-temperature AFM, such

Charged particle single nanometre manufacturing

• Philip D. Prewett,
• Cornelis W. Hagen,
• Claudia Lenk,
• Steve Lenk,
• Marcus Kaestner,
• Tzvetan Ivanov,
• Ahmad Ahmad,
• Ivo W. Rangelow,
• Xiaoqing Shi,
• Stuart A. Boden,
• Alex P. G. Robinson,
• Dongxu Yang,
• Sangeetha Hari,
• Marijke Scotuzzi and
• Ejaz Huq

Beilstein J. Nanotechnol. 2018, 9, 2855–2882, doi:10.3762/bjnano.9.266

• uses so-called active cantilevers in cantilever scanning configuration [146]. These are self-actuated and self-sensing scanning probes [147], which can be used both for lithography and for measuring the generated structures by atomic force microscopy and related techniques such as Kelvin force

Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis

• Omur E. Dagdeviren and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2017, 8, 657–666, doi:10.3762/bjnano.8.70

• ; noncontact atomic force microscopy; quartz tuning forks; scanning tunneling microscopy; self-sensing probe; Introduction Scanning tunneling microscopy (STM) [1] and non-contact atomic force microscopy (NC-AFM) [1][2][3] are powerful methods allowing the visualization of the atomic structure of a surface

• allowed to vibrate freely while the other one is attached onto a holder [19][21], have previously been used to conduct combined STM/AFM experiments. Among these, quartz tuning forks in qPlus configuration have gained the widest popularity as they offer several advantages such as self-sensing properties

Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement

• Steven Ian Moore,
• Michael G. Ruppert and
• Yuen Kuan Yong

Beilstein J. Nanotechnol. 2017, 8, 358–371, doi:10.3762/bjnano.8.38

• Steven Ian Moore Michael G. Ruppert Yuen Kuan Yong The School of Electrical Engineering and Computer Science, The University of Newcastle, Callaghan NSW 2308, Australia 10.3762/bjnano.8.38 Abstract Self-sensing techniques for atomic force microscope (AFM) cantilevers have several advantageous

• multifrequency AFM and has the potential to provide higher resolution imaging on higher order modes. Keywords: atomic force microscopy; multifrequency AFM; multimodal AFM; piezoelectric cantilever, self-sensing; Introduction The invention of the atomic force microscope (AFM) [1] provided for the observation of

• additional circuitry for instrumentation compared to a typical two terminal piezoelectric cantilever. For this reason, we have proposed a grounded load charge sensor and a grounded load charge amplifier to realize the self-sensing implementation. The experimental results show that by shaping the electrodes

Dynamic of cold-atom tips in anharmonic potentials

• Tobias Menold,
• Peter Federsel,
• Carola Rogulj,
• Hendrik Hölscher,
• József Fortágh and
• Andreas Günther

Beilstein J. Nanotechnol. 2016, 7, 1543–1555, doi:10.3762/bjnano.7.148

• interferometry [45][46] or self-sensing [47][48][49]. For cold-atomic ensembles, the standard detection method is absorption imaging [50]. Here, the atoms are illuminated with coherent light, and a shadow image of the cloud is recorded on a CCD chip. This yields a two-dimensional density profile of the cold-atom

Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air

• Hannes Beyer,
• Tino Wagner and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2016, 7, 432–438, doi:10.3762/bjnano.7.38

• [4][5]. Recently, atomic resolution has been achieved with a qPlus sensor in air on potassium bromide and graphite [2][6]. In this paper, we demonstrate the suitability of the piezoelectric self-sensing length-extension resonator (LER) [7][8] for high-resolution FM-AFM imaging in air. The LER has a

High-bandwidth multimode self-sensing in bimodal atomic force microscopy

• Michael G. Ruppert and
• S. O. Reza Moheimani

Beilstein J. Nanotechnol. 2016, 7, 284–295, doi:10.3762/bjnano.7.26

• standard microelectromechanical system (MEMS) processes to coat a microcantilever with a piezoelectric layer results in a versatile transducer with inherent self-sensing capabilities. For applications in multifrequency atomic force microscopy (MF-AFM), we illustrate that a single piezoelectric layer can be

• strain sensitivity on the fifth eigenmode leading to a remarkable signal-to-noise ratio. Experimental results using bimodal AFM imaging on a two component polymer sample validate that the self-sensing scheme can therefore be used to provide both the feedback signal, for topography imaging on the

• fundamental mode, and phase imaging on the higher eigenmode. Keywords: atomic force microscopy; charge sensing; feedthrough cancellation; multimode sensor; piezoelectric cantilever; self-sensing; Introduction Emerging methods in multifrequency atomic force microscopy (MF-AFM) rely on the detection and

A simple method for the determination of qPlus sensor spring constants

• John Melcher,
• Julian Stirling and
• Gordon A. Shaw

Beilstein J. Nanotechnol. 2015, 6, 1733–1742, doi:10.3762/bjnano.6.177

• provided highly-stable frequencies with self-sensing and self-actuating electromechanical properties all at low cost [6]. Tuning fork sensors were originally used as a traditional, dual-tine oscillator. This evolved into the more widely used qPlus configuration where the sensing tine oscillates and the

A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

• Tobias Meier,
• Alexander Förste,
• Ali Tavassolizadeh,
• Karsten Rott,
• Dirk Meyners,
• Roland Gröger,
• Günter Reiss,
• Eckhard Quandt,
• Thomas Schimmel and
• Hendrik Hölscher

Beilstein J. Nanotechnol. 2015, 6, 451–461, doi:10.3762/bjnano.6.46

• , Universitässtraße 25, 33615 Bielefeld, Germany Institute of Applied Physics, Karlsruhe Institute of Technology (KIT), Wolfgang-Gaede-Straße 1, 76131 Karlsruhe, Germany 10.3762/bjnano.6.46 Abstract We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR

• different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers. Keywords: atomic force microscopy (AFM); magnetomechanical

• excitation [16] and interfere with the sample as it can cause photobleaching of fluorescence samples [17]. For specific applications and environments like vacuum, self-sensing tuning forks with manually attached tips can greatly simplify instrumentation but at the cost of reduced operation modes [18][19][20

Spring constant of a tuning-fork sensor for dynamic force microscopy

• Dennis van Vörden,
• Manfred Lange,
• Merlin Schmuck,
• Nico Schmidt and
• Rolf Möller

Beilstein J. Nanotechnol. 2012, 3, 809–816, doi:10.3762/bjnano.3.90

• taking account of the real geometry including the glue that is used to mount the tuning fork. Keywords: atomic force microscopy; finite element method; spring constant; thermal fluctuation; tuning fork; Introduction Quartz tuning forks provide excellent self-sensing probes in scanning probe microscopy

Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique

• Zsolt Majzik,
• Martin Setvín,
• Andreas Bettac,
• Albrecht Feltz,
• Vladimír Cháb and
• Pavel Jelínek

Beilstein J. Nanotechnol. 2012, 3, 249–259, doi:10.3762/bjnano.3.28

• , piezoelectric quartz tuning forks similar to those used as frequency references in watches. The configuration when one of the prongs is attached to a solid substrate and the free prong acts as a cantilever with the capability of self-sensing, is called qPlus, named by Giessibl [12]. One of the largest benefits

• sample opens a new horizon in the understanding of elemental processes of the electron transport on surfaces [30] and in clarifying the relationship between the short-range force and the tunneling current in metal contacts [31][32]. Unfortunately, in the case of quartz-based sensors with self-sensing