Thematic Series – Call for Papers – Submit NOW

published on 15 Nov 2017

Thematic Series currently open for submission: (1) Sub-10 nm technology node (2) Light–Matter interactions (3) Topological materials (4) SPM for energy

We currently have four open Call for Papers where you can submit your most exciting, original research to the Beilstein Journal of Nanotechnology (BJNANO) as a peer-reviewed article for the Thematic Series “Metrology and technology computer aided design for the sub-10 nm technology node", "Light–Matter interactions on the nanoscale", “Topological materials” and “Scanning probe microscopy for energy-related materials”. Please find more detailed information below. Note that we accept submissions in all other subfields of nanotechnology on a continuous basis for our regular BJNANO journal stream.

Why BJNANO?

BJNANO is a platinum open-access journal (submission fees are fully funded by the Beilstein-Institut, all articles remain open access), publishing high-quality peer-reviewed articles that are archived and indexed in all major repositories, search engines and databases – complete with a DOI specific to your paper. You retain the rights to your paper according to the Creative Commons Attribution License agreement. To ensure only high-quality articles are published, each article undergoes an initial quality check, plagiarism check and peer review.

Thematic Series

BJNANO began publishing theme-grouped volumes (Thematic Series) in 2010 and has demonstrated great success with more than 50 Thematic Series published to date. Note that the articles of this series will appear together on the Thematic Series webpage, but will be individually published in the regular BJNANO stream as soon as they are completed – no waiting on the entire volume to be accepted before your article is available online!

Before submitting your article, please carefully review the Instructions for Authors and consult the Beilstein Journal of Nanotechnology Editorial Team if you have questions regarding submission and processing of your article.

 


(1) Metrology and technology computer aided design for the sub-10 nm technology node

Scaling towards the sub-10 nm technology node involves the development of new materials (e.g., Ge, III-V, graphene) and new device architectures (e.g., FinFETs, GAA-FETs, thin-film FETs). The more complex underlying physics at this scale and the exponential increase of technological options has led to growing integration challenges, and hence, to a growing need for technology computer aided design (TCAD) simulations. Furthermore, the development of TCAD tools is intimately linked with the development of advanced metrology solutions to calibrate them. Thus, this Thematic Series aims to present recent progresses in advanced metrology and innovative solutions necessitating physical simulations to replace experiments and facilitate the rapid development of new devices. Additionally, this Thematic Series will highlight the current integration challenges for such new devices. Potential topics for manuscripts include, but are not limited to:

- 2D/3D dopant and carrier profiling techniques with nanometer resolution
- Metrology techniques that provide information about sub-10 nm structures with sufficient depth and 2D/3D resolution (e.g., electrical AFM, atom probe or electron holography, TOF-SIMS, s-SNOM, TEM)
- New high-mobility channel materials (III-V and Ge)
- Thin body (ultra-thin SOI, double or tri-gate multigates, nanowires) and vertical gate-all-around device architectures
- Novel contact and doping techniques for low-access resistance
- Physical simulations (ab-initio, molecular dynamics, lattice/on-lattice kinetic Monte Carlo, partial differential equations) for the development of new sub-10 nm devices

Submission deadline: February 15, 2018

 

How to Submit

Please inform Dr. Eyben if you intend to submit a manuscript, and if so, in which format (Review, Research Article or Letter). Please submit your article directly to the Beilstein Publishing System along with your cover letter containing the following information:

Thematic Series: Metrology and technology CAD for the sub-10 nm technology node
Guest Editors: Pierre Eyben, Ray Duffy, Narciso Gambacorti, Enrico Napolitani

Please contact Dr. Eyben with any questions regarding the scope of this Thematic Series.

Dr. Pierre Eyben / IMEC, Belgium
Dr. Ray Duffy / Tyndall National Institute/University College Cork, Ireland
Dr. Narciso Gambacorti / Nanocharacterization platform - CEA- LETI, France
Prof. Enrico Napolitani / CNR-IMM MATIS/University of Padova, Italy

 


(2) Light–Matter interactions on the nanoscale

Nano-optics has become a very efficient tool to control light–matter interactions beyond the diffraction limit. The understanding of the optical response from individual and coupled nanoparticles has led to unprecedented development in a wide spectrum of scientific disciplines, ranging from molecular optics and biology, to nonlinear spectroscopy and clean energy. Research in the field of nano-optics now presents an opportunity to build on the existing work and establish novel directions for this area of research. 

Potential topics for manuscripts include, but are not limited to:

- Metallic & plasmonic nanomaterials
- Dielectric and semiconductor nanostructures
- Nonlinear nano-optics
- Nearfield optics
- Optofluidics
- Enhanced spectroscopy and sensing
- Nano-optomechanics
- Quantum nano-optics
- 2D luminescent materials
- Enhanced nano lasers and LEDs

Submission Deadline: November 1, 2017

 

How to Submit

Please inform Dr. Rahmani if you intend to submit a manuscript, and if so, in which format (Review, Research Article or Letter). When you are ready to submit your article, please upload it directly to the Beilstein Publishing System along with your cover letter containing the following information:

Thematic Series: Light–Matter interactions on the nanoscale
Guest Editors: Dr. Mohsen Rahmani,  Prof. Chennupati Jagadish

Please contact Dr. Rahmani with any questions regarding the scope of this Thematic Series.

Dr. Mohsen Rahmani and Prof. Chennupati Jagadish / Australian National University

 


(3) Topological materials

“Topological materials” has become one the most active research areas in condensed matter physics in recent years. These materials deserve such a denomination because their physical properties are inherited from topology in a deep sense. Topology is a branch of mathematics which loosely translates into physics with the study of properties of objects that are invariant under smooth deformations. Topological insulators, for instance, are ordinary insulators in bulk, but display conducting states on the surface or edges that cannot be easily removed by disorder and, at the same time, present very exotic behavior. Since the discovery of topological insulators roughly a decade ago, the field has rapidly expanded with the identification of other topological materials, such as topological superconductors and Weyl semimetals. This series will be a collection of state-of-the-art research on these materials, highlighting current progress and a perspective for the future of this exciting field.

Potential topics for manuscripts include, but are not limited to:

- Topological insulators and superconductors
- Hybrid devices (quantum dots, nanowires, heterostructures)
- Weyl semimetals
- Topological quantum computing
- Majorana fermions

Submission Deadline: December 1, 2017

 

How to Submit

Please inform Prof. Palacios if you intend to submit a manuscript, and if so, in which format (Review, Research Article or Letter). When you are ready to submit your article, please upload it directly to the Beilstein Publishing System along with your cover letter containing the following information:

Thematic Series: Topological materials
Guest Editors: Prof. Juan Jose Palacios, Prof. Elsa Prada, Prof. Alfredo Levy Yeyati

Please contact Prof. Palacios with any questions regarding the scope of this Thematic Series.

Prof. Juan Jose Palacios, Prof. Elsa Prada and Prof. Alfredo Levy Yeyati / Universidad Autónoma de Madrid

 


(4) Scanning probe microscopy for energy-related materials

Our aim is to collect a group of peer-reviewed articles focused on scanning probe microscopy related to energy conversion and storage applications. In particular, we wish to stimulate the development and utilization of new SPM methods which could advance our understanding of energy-related materials (e.g., the newly developed time-resolved electrostatic modes of SPM, or advanced modes combining nanomechanical and potentiometric imaging capabilities). A deeper understanding of advanced SPM methods and its theory for energy applications is highly desirable.
Potential topics for manuscripts include, but are not limited to:

- Advanced SPM methods for electrical and mechanical property characterization
- Novel materials for photovoltaics and batteries
- Local performance of (hybrid) solar cells, batteries, supercapacitors and thermoelectric devices
- Time-resolved EFM/KPFM imaging of the charge carrier dynamics of energy devices
- (Photo)degradation of energy materials and devices
- Novel architectures for batteries
- Novel methods for electrochemical surface characterization
- Piezo–force microscopy on piezoelectric materials for energy harvesting

Submission Deadline: December 15, 2017

 

How to Submit

Please inform Dr. Leclère if you intend to submit a manuscript, and if so, in which format (Review, Research Article or Letter). When you are ready to submit your article, please upload it directly to the Beilstein Publishing System along with your cover letter containing the following information:

Thematic Series: Scanning probe microscopy for energy-related materials
Guest Editors: Rüdiger Berger, Benjamin Grévin, Yi Zhang, Philippe Leclère

Please contact Dr. Leclère with any questions regarding the scope of this Thematic Series.

Dr. Rüdiger Berger / Max Planck Institute for Polymer Research
Dr. Benjamin Grévin / UMR5819 CEA-CNRS-UGA, CEA-Grenoble INAC/SYMMES
Dr. Yi Zhang / Shanghai Institute of Applied Physics, Chinese Academy of Sciences
Dr. Philippe Leclère / CIRMAP, University of Mons

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