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Self-assembly of silicon nanowires studied by advanced transmission electron microscopy

Marta Agati1,2,3, Guillaume Amiard2,4, Vincent Le Borgne3, Paola Castrucci5, Richard Dolbec6, Maurizio De Crescenzi5, My Alì El Khakani3 and Simona Boninelli2
1Dipartimento di Fisica e Astronomia, Università di Catania, Via S. Sofia 64, Catania 95123, Italy
2CNR IMM-MATIS, Via S. Sofia 64, Catania 95123, Italy
3Institut national de la recherche scientifique, Centre-Énergie, Matériaux et Télécommunications (INRS-EMT), 1650 Blvd. Lionel Boulet, Varennes QC-J3X 1S2, Canada
4Institut Pprime, UPR 3346, CNRS - Université de Poitiers, ISAE-ENSMA, 11 Boulevard Marie et Pierre Curie, 86962 Futuroscope-Chasseneuil, France
5Dipartimento di Fisica, Università di Roma “Tor Vergata”, Via della Ricerca Scientifica 1, Roma 00133, Italy,
6Tekna Plasma Systems Inc., 2935 Industrial Blvd., Sherbrooke QC-J1L 2T9, Canada
Email of corresponding author Corresponding author email     
This article is part of the Thematic Series "Self-assembly of nanostructures and nanomaterials II".
Guest Editor: I. Berbezier
Beilstein J. Nanotechnol. 2017, 8, 440–445.
doi:10.3762/bjnano.8.47
 
 
 
 
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© 2017 Agati et al.; licensee Beilstein-Institut.
This is an Open Access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (http://www.beilstein-journals.org/bjnano)