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Analysis and modification of defective surface aggregates on PCDTBT:PCBM solar cell blends using combined Kelvin probe, conductive and bimodal atomic force microscopy

Hanaul Noh, Alfredo J. Diaz and Santiago D. Solares§
Department of Mechanical and Aerospace Engineering, The George Washington University, Washington, DC 20052, United States of America
Email of corresponding author Corresponding author email     
§ Phone: +1 (202) 994-0372
This article is part of the Thematic Series "Advanced atomic force microscopy".
Guest Editor: T. Glatzel
Beilstein J. Nanotechnol. 2017, 8, 579–589.
doi:10.3762/bjnano.8.62
 
 
 
 
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© 2017 Noh et al.; licensee Beilstein-Institut.
This is an Open Access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (http://www.beilstein-journals.org/bjnano)