Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

Mehmet Z. Baykara, Omur E. Dagdeviren, Todd C. Schwendemann, Harry Mönig, Eric I. Altman and Udo D. Schwarz
Beilstein J. Nanotechnol. 2012, 3, 637–650. https://doi.org/10.3762/bjnano.3.73

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Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
Mehmet Z. Baykara, Omur E. Dagdeviren, Todd C. Schwendemann, Harry Mönig, Eric I. Altman and Udo D. Schwarz
Beilstein J. Nanotechnol. 2012, 3, 637–650. https://doi.org/10.3762/bjnano.3.73

How to Cite

Baykara, M. Z.; Dagdeviren, O. E.; Schwendemann, T. C.; Mönig, H.; Altman, E. I.; Schwarz, U. D. Beilstein J. Nanotechnol. 2012, 3, 637–650. doi:10.3762/bjnano.3.73

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