Optical properties and electrical transport of thin films of terbium(III) bis(phthalocyanine) on cobalt

Peter Robaschik, Pablo F. Siles, Daniel Bülz, Peter Richter, Manuel Monecke, Michael Fronk, Svetlana Klyatskaya, Daniel Grimm, Oliver G. Schmidt, Mario Ruben, Dietrich R. T. Zahn and Georgeta Salvan
Beilstein J. Nanotechnol. 2014, 5, 2070–2078. https://doi.org/10.3762/bjnano.5.215

Supporting Information

The Supporting Information shows the raw data obtained from ellipsometry and the corresponding model fit for one sample. Furthermore, a statistical analysis of the AFM data is included.

Supporting Information File 1: Ellipsometry and AFM analysis.
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Cite the Following Article

Optical properties and electrical transport of thin films of terbium(III) bis(phthalocyanine) on cobalt
Peter Robaschik, Pablo F. Siles, Daniel Bülz, Peter Richter, Manuel Monecke, Michael Fronk, Svetlana Klyatskaya, Daniel Grimm, Oliver G. Schmidt, Mario Ruben, Dietrich R. T. Zahn and Georgeta Salvan
Beilstein J. Nanotechnol. 2014, 5, 2070–2078. https://doi.org/10.3762/bjnano.5.215

How to Cite

Robaschik, P.; Siles, P. F.; Bülz, D.; Richter, P.; Monecke, M.; Fronk, M.; Klyatskaya, S.; Grimm, D.; Schmidt, O. G.; Ruben, M.; Zahn, D. R. T.; Salvan, G. Beilstein J. Nanotechnol. 2014, 5, 2070–2078. doi:10.3762/bjnano.5.215

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