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Cite the Following Article
Noise in NC-AFM measurements with significant tip–sample interaction
Jannis Lübbe, Matthias Temmen, Philipp Rahe and Michael Reichling
Beilstein J. Nanotechnol. 2016, 7, 1885–1904.
https://doi.org/10.3762/bjnano.7.181
How to Cite
Lübbe, J.; Temmen, M.; Rahe, P.; Reichling, M. Beilstein J. Nanotechnol. 2016, 7, 1885–1904. doi:10.3762/bjnano.7.181
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