High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads

Benjamin Grévin, Pierre-Olivier Schwartz, Laure Biniek, Martin Brinkmann, Nicolas Leclerc, Elena Zaborova and Stéphane Méry
Beilstein J. Nanotechnol. 2016, 7, 799–808. https://doi.org/10.3762/bjnano.7.71

Supporting Information

Comparison of nc-AFM topographic images of the AD1 and AD3 films. nc-AFM/KPFM images (topography, damping, CPD) of the AD3 film recorded in dark conditions. 3D representation of two lamellae with different in-plane π-stacking directions. Surface photo-voltage as a function of the illumination intensity. KPFM potential images recorded in dark and under illumination at 685 nm, 515 nm and 405 nm. Estimation of the SPV lateral resolution (3 series of topographic and KPFM potential images recorded in dark and under illumination). Correction procedure used for the SPV image calculation. High-resolution topographic and SPV cross sections over an edge-on lamellae.

Supporting Information File 1: Additional experimental results.
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Cite the Following Article

High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads
Benjamin Grévin, Pierre-Olivier Schwartz, Laure Biniek, Martin Brinkmann, Nicolas Leclerc, Elena Zaborova and Stéphane Méry
Beilstein J. Nanotechnol. 2016, 7, 799–808. https://doi.org/10.3762/bjnano.7.71

How to Cite

Grévin, B.; Schwartz, P.-O.; Biniek, L.; Brinkmann, M.; Leclerc, N.; Zaborova, E.; Méry, S. Beilstein J. Nanotechnol. 2016, 7, 799–808. doi:10.3762/bjnano.7.71

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