1 article(s) from Chlouba, Tomáš
P- and B-concentrations as measured by MCs+-SIMS as function of PH3 to SiH4 gas flow ratio, or resp...
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(a) Atom probe tomography reconstruction of P-doped Si nanocrystals (red iso-surfaces with ≥70 atom...
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(a) Room temperature photoluminescence spectra of P-incorporating Si NCs in SRON (0–0.48 atom %) an...
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Low-temperature PL data of samples with 5 nm SRO and 0.59 atom % P (SRO:P), 0.47 atom % B (SRO:B) a...
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Transient transmission (TT) dynamics from pump-probe measurements at room temperature of ≈4.5 nm Si...
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J–E data of injection-blocking MOS-capacitors with P- or B-incorporating Si NCs in SRO and SRON and...
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(a) J–t transients of the same MOS-capacitors as in the previous figure measured at E = 0.2 MV/cm. ...
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Beilstein J. Nanotechnol. 2018, 9, 1501–1511, doi:10.3762/bjnano.9.141
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