1 article(s) from Einsle, Joshua F

Helium ion microscope – secondary ion mass spectrometry for geological materials

  1. Matthew R. Ball,
  2. Richard J. M. Taylor,
  3. Joshua F. Einsle,
  4. Fouzia Khanom,
  5. Christelle Guillermier and
  6. Richard J. Harrison
  • Full Research Paper
  • Published 02 Oct 2020

  • PDF
Graphical Abstract

Beilstein J. Nanotechnol. 2020, 11, 1504–1515, doi:10.3762/bjnano.11.133

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