3 article(s) from Feng, Wei
Computational screening. (a) Models for six low-index surfaces (unrelaxed); (b) Calculated values o...
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CuO catalyst characterization. (a,b) TEM images of CuO NWs; (c) TEM image of CuO NBs (inset is the ...
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CH4 conversion against the temperature. (a) Heating profile (Tmax = 850 °C) for NBs, NWs and NPs, w...
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CH4 oxidation mechanism by computational calculations. (a) Clean (001); (b) CH4 physical adsorption...
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Energy profile for CH4 oxidation. The geometries are shown in Figure 4.
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Beilstein J. Nanotechnol. 2018, 9, 2526–2532, doi:10.3762/bjnano.9.235
(a) XRD and (b) grain percentages obtained from integration of the intensity of the XRD peaks of th...
Microstructure and crystal growth orientation of ZnO grown on silicon substrates. (a) ZnO(100) on t...
SEM images of the samples (a) ZnOp(100), (b) ZnOp(111), and (c) ZnOt(100).
AFM images (5 × 5 μm) of the samples (a) ZnOp(100) (Rq: 48.488 nm), (b) ZnOp(111) (Rq: 48.284 nm), ...
(a) The lattice mismatch between a ZnO(110) unit cell of 5.63 Å (× lattice constant a) by 5.20 Å (l...
(a) Average grain size versus strain and (b) average grain size versus cathode luminescence (CL) in...
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Cathode luminescence spectra of the samples (a) ZnOp(100), (b) ZnOp(111), and (c) ZnOt(100) with th...
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Reflectance spectra of the samples (a) ZnOp(100), (b) ZnOp(111), and (c) ZnOt(100) at room temperat...
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Beilstein J. Nanotechnol. 2017, 8, 1939–1945, doi:10.3762/bjnano.8.194
AFM images (5 × 5 μm) of (a) c-20 (16.603 nm), (b) c-40 (26.756 nm), (c) c-60 (51.531 nm), and (d) c...
SEM images of the (a) c-20, (b) c-40, (c) c-60, and (d) c-70 ZnO@B samples and the panchromatic CL ...
Cross-sectional SEM images of the (a) c-20, (b) c-40, (c) c-60, and (d) c-70 ZnO@B samples. The thi...
CL spectra of the (a) c-20, (b) c-40, (c) c-60, and (d) c-70 ZnO@B samples for excitations of 5, 7,...
Absorbance (squared) of the four ZnO@B samples.
Raman scattering spectra of the four ZnO@B samples. The spectra display A1(TO) and A1(LO) modes for...
In-plane strain for the four ZnO@B samples as a function of ZnO thickness.
Beilstein J. Nanotechnol. 2016, 7, 75–80, doi:10.3762/bjnano.7.9
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