1 article(s) from Folkersma, Steven
Top-view schematic of the four μ4pp electrodes landed on (a) a single fin and (b) two fins. The ele...
Jump to Figure 1
(a) Measured fin resistance Rfin as a function of fin width Wfin on isolated (triangle) and dense (...
Jump to Figure 2
(a) TEM image of four ca. 20 nm wide Si fins where the measured Rfin is indicated on top of each fi...
Jump to Figure 3
Beilstein J. Nanotechnol. 2018, 9, 1863–1867, doi:10.3762/bjnano.9.178
Subscribe to our Latest Articles RSS Feed.
Register and get informed about new articles.
Follow the Beilstein-Institut