2 article(s) from García-Martín, José Miguel
Outline of the AFIR process. Si(100) wafers with a native layer of SiO2 were coated with Fe2O3. Ant...
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(a) SEM image of the antidot array patterned on the film with 27 nm thickness. (b) Profile obtained...
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XRD patterns of the as-deposited Fe2O3 film (blue curve) and the Fe3O4 film (red curve) after the t...
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Central region of the hysteresis curves for the antidot arrays obtained from a 27 nm thick film. (a...
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(a) Coercivity of the initial thin film and of the square (blue squares) and the hexagonal (red tri...
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Coercivity (red squares) and normalized remanence (blue dots) as a function of the angle θ at which...
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Beilstein J. Nanotechnol. 2018, 9, 1728–1734, doi:10.3762/bjnano.9.164
Scheme of the sputtering process with glancing angle deposition and rotating substrate.
(a) Photograph, (b) AFM images, and (c) SEM images (upper row: top view, lower row: fracture cross ...
(a) Diameter distribution obtained from top-view SEM images for the Au samples prepared onto Si sub...
Reflectance spectra of nanostructured Au samples exhibiting black color (a) and golden color (b). F...
(a) Photograph of two samples prepared onto MgO substrates: a continuous Au thin film prepared with...
Beilstein J. Nanotechnol. 2017, 8, 434–439, doi:10.3762/bjnano.8.46
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