2 article(s) from Haverkamp, Caspar
(a) Scanning electron micrograph of a FEBID pad. (b) Atomic force micrograph of the same pad. (c + ...
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(a) Raman spectra of a FEBID pad, FEBID precursor and the substrate. The complex structure of the p...
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(a) Real and (b) imaginary part of the dielectric function of the measured FEBID material, averaged...
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(a + b) Scanning electron micrographs of a single nanopillar (a) and a copper helix with three pitc...
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(a) Array of 8 × 8 nanocones with a distance of 400 nm, base diameter of 80 nm and a height of 250 ...
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Beilstein J. Nanotechnol. 2018, 9, 1220–1227, doi:10.3762/bjnano.9.113
Scanning electron micrographs of deposits from (a, e) AgO2Me2Bu and (b, f) AgO2F5Prop using a beam ...
Dwell-time series for a beam current of 150 pA using (a) AgO2Me2Bu and (b) AgO2F5Prop as precursor ...
Scanning electron micrographs of single silver pillars obtained after continuous spot irradiation f...
Beilstein J. Nanotechnol. 2018, 9, 842–849, doi:10.3762/bjnano.9.78
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