2 article(s) from Keller, Thomas
(a) Sketch of the experiment for structure and reflectometric measurements and (b) setup for the tr...
Jump to Figure 1
RHEED patterns of (a) the Al2O3() substrate, (b) the Pt cap layer, and the Nb buffer layer grown at...
Jump to Figure 2
X-ray diffraction patterns of (a) sample s3 and (b) sample s6. Dashed tilted lines show the directi...
Jump to Figure 3
SQUID data of the s3 sample. (a) Hysteresis loop measured at T = 300 K (red) and T = 13 K (black). ...
Jump to Figure 4
(a) Experimental (dots) and model (lines) reflectivity curves measured on sample s3 at T = 13 K and ...
Jump to Figure 5
(a) (T) for the samples s4 (black) and s3 (red) in the vicinity of the superconducting transition m...
Jump to Figure 6
Beilstein J. Nanotechnol. 2020, 11, 1254–1263, doi:10.3762/bjnano.11.109
The normalized critical current of the S/F/s/F/S (solid lines) and S/F/N/F/S (dashed lines) structu...
(a) The depth profile of the superconducting pair potential amplitude of the S/[F1/s/F2/s]5/F1/S st...
Experimental (dots) specular neutron reflectivity measured at T = 13 K in magnetic fields H = 300 O...
(a) Magnetic depth profiles of one unit cell for the P (black) and AP (red) alignment. Correspondin...
Beilstein J. Nanotechnol. 2019, 10, 833–839, doi:10.3762/bjnano.10.83
Subscribe to our Latest Articles RSS Feed.
Register and get informed about new articles.
Follow the Beilstein-Institut