1 article(s) from Kirpal, Dominik J.
- Full Research Paper
- Published 30 Oct 2019
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Figure 1: 1D schematic of the tip–sample convolution at islands and holes. Due to the tip geometry step edges...
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Figure 2: 1.5 μm × 1.0μm sections showing the time evolution of artificial defects and accumulations in three...
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Figure 3: Maximum depth of the observed holes over time. The poking holes to which the letters correspond is ...
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Figure 4: 200 nm × 200 nm 3D profile image of the generated scratching site directly taken after generating, ...
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Figure 5: Volume of the hole and accumulation at 3.0% < RH < 5.5% within seven days. No significant change in...
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Figure 6: 250 nm × 250 nm images of the time evolution of both defect and accumulation at different consecuti...
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Figure 7: Time evolution of both defect and accumulation volume. After an initial settling time the logarithm...
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Figure 8: 200 nm × 200 nm sections of the time evolution of the scratching site at RH = 28.2%. Each image is ...
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Figure 9: Time course of the size and change rate of the observed defect (upper position) and accumulation (l...
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