3 article(s) from Klingner, Nico

Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector

  1. Eduardo Serralta,
  2. Nico Klingner,
  3. Olivier De Castro,
  4. Michael Mousley,
  5. Santhana Eswara,
  6. Serge Duarte Pinto,
  7. Tom Wirtz and
  8. Gregor Hlawacek
  • Full Research Paper
  • Published 11 Dec 2020

  • PDF
Graphical Abstract

Beilstein J. Nanotechnol. 2020, 11, 1854–1864, doi:10.3762/bjnano.11.167

Imaging and milling resolution of light ion beams from helium ion microscopy and FIBs driven by liquid metal alloy ion sources

  1. Nico Klingner,
  2. Gregor Hlawacek,
  3. Paul Mazarov,
  4. Wolfgang Pilz,
  5. Fabian Meyer and
  6. Lothar Bischoff
  • Full Research Paper
  • Published 18 Nov 2020

  • PDF
Graphical Abstract

Beilstein J. Nanotechnol. 2020, 11, 1742–1749, doi:10.3762/bjnano.11.156

Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns

  1. Michael Mousley,
  2. Santhana Eswara,
  3. Olivier De Castro,
  4. Olivier Bouton,
  5. Nico Klingner,
  6. Christoph T. Koch,
  7. Gregor Hlawacek and
  8. Tom Wirtz
  • Full Research Paper
  • Published 07 Aug 2019

  • PDF

  • Supp. Info
Graphical Abstract

Beilstein J. Nanotechnol. 2019, 10, 1648–1657, doi:10.3762/bjnano.10.160

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