2 article(s) from Kopalko, Krzysztof
Figure 1: Detailed sequence of GaAs surface-processing steps before the application of the ALD process (the p...
Figure 2: The PV structure used in the experiment.
Figure 3: AFM (left panels), SEM top views (right panels), and cross-sections (insets) of A-type samples (the...
Figure 4: AFM (left panels), SEM top views (right panels), and cross-sections (insets) of B-type samples (the...
Figure 5: (a–h) A2 spectra after 58 (a–d) and 76 min (e–h) of sputtering. (i–p) B1 spectra after 35 (i–l) and...
Figure 6: (a) PL spectra (RT) of the samples of the A series. (b) PL spectra (RT) of the samples of the B ser...
Figure 7: Energy band diagram of the fabricated AZO/Al2O3/p-GaAs devices.
Figure 8: (a) EQE of sulfur-passivated samples (A series). (b) EQE of non-passivated samples (B series).
Figure 9: I–V characteristics of the measured samples of A series (a) and B series (b).
Figure 1: Schematic drawings of the investigated solar cells structure based on zinc oxide nanorods (not to s...
Figure 2: Cross-section and top view (up) SEM images illustrating zinc oxide nanorods grown at different pH v...
Figure 3: Current–voltage characteristics for the ZnO:Al/ZnONR/Si/Al heterostructures measured under dark (to...
Figure 4: SEM images of the three investigated types of structures with different surface morphologies.
Figure 5: External quantum efficiency of the PV structures of samples A, B and C based on zinc oxide nanorods....