1 article(s) from Mangelinck, Dominique
- Full Research Paper
- Published 09 Dec 2014
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Figure 1: SEM images acquired during APT sample preparation in a dual-beam FIB process. The image sequence (a...
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Figure 2: Sketch of the sample structure and AFM measurements performed on the sample surface after MBE growt...
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Figure 3: APT volume (100 × 100 × 90 nm3) obtained from the sample. Green, gray, red and blue dots correspond...
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Figure 4: Top-down, 1D Ge concentration profiles measured between the islands in two different samples. The p...
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Figure 5: Cross-sectional TEM image of a typical dome island (a), and side-views of two different APT volumes...
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Figure 6: APT volume showing 2% of the Ni atoms, 5% of the Ge atoms, and 100% of the O atoms (the Si atoms ar...
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Figure 7: Top-down 1D Ge concentration profiles measured in two different APT volumes, one in the direction p...
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Figure 8: APT analysis: (a) 3D volume (120 × 120 × 100 nm3), (b) 2D map of the Ge concentration distribution ...
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Figure 9: (a) APT volume (90 × 90 × 130 nm3) and (b) Si and Ge 1D concentration profiles measured in (a). Figure 9c in...
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Figure 10: (a) APT volume (70 × 70 × 85 nm3) and (b) Si and Ge 1D concentration profiles measured in this volu...
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Figure 11: APT measurements obtained for four APT volumes (green and red surfaces) which form almost half of a...
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