1 article(s) from Meyners, Dirk
Schematic and photo of the setup including the optical beam deflection and the nested scanner desig...
Jump to Figure 1
A crucial precondition for a nested high resolution scanner design is the stability of the housing ...
Jump to Figure 2
a) Optical microscopy image of a SiOx calibration grating with various feature sizes. Demonstration...
Jump to Figure 3
a) Overlay of the optical microscope image with the AFM topography of an optical grating structure ...
Jump to Figure 4
Characterization of AFM cantilevers equipped with strain sensitive TMR sensors. a) The cantilevers ...
Jump to Figure 5
a) To improve lateral resolution, tips with a tip radius of 30 nm were grown by a combination of fo...
Jump to Figure 6
Dynamic mode imaging of FDTS-SAM samples using a TMR sensor with the feedback on amplitude and phas...
Jump to Figure 7
Beilstein J. Nanotechnol. 2015, 6, 451–461, doi:10.3762/bjnano.6.46
Subscribe to our Latest Articles RSS Feed.
Register and get informed about new articles.
Follow the Beilstein-Institut