1 article(s) from Mocking, Tijs F.
- Full Research Paper
- Published 12 Jul 2012
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Figure 1: HIM images with a FoV of 20 μm of thin organic layers on Si{001}. Data was recorded with a PE of 15...
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Figure 2: HIM images of single-layer 6P islands on Si{001}, recorded with PE of 20 keV and an ion dose of 3.2...
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Figure 3: Co-containing nanocrystals on Ge{001} (FoV: 1 μm) (a) High-resolution ET image obtained with a PE o...
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Figure 4: Simulation of dechanneling contrast for clean and carbon-covered Si. The graphs show the opaque fra...
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