1 article(s) from Mocking, Tijs F.
Figure 1: HIM images with a FoV of 20 μm of thin organic layers on Si{001}. Data was recorded with a PE of 15...
Figure 2: HIM images of single-layer 6P islands on Si{001}, recorded with PE of 20 keV and an ion dose of 3.2...
Figure 3: Co-containing nanocrystals on Ge{001} (FoV: 1 μm) (a) High-resolution ET image obtained with a PE o...
Figure 4: Simulation of dechanneling contrast for clean and carbon-covered Si. The graphs show the opaque fra...