1 article(s) from Mocking, Tijs F.

Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism

  1. Gregor Hlawacek,
  2. Vasilisa Veligura,
  3. Stefan Lorbek,
  4. Tijs F. Mocking,
  5. Antony George,
  6. Raoul van Gastel,
  7. Harold J. W. Zandvliet and
  8. Bene Poelsema
  • Full Research Paper
  • Published 12 Jul 2012

  • PDF
Graphical Abstract

Beilstein J. Nanotechnol. 2012, 3, 507–512, doi:10.3762/bjnano.3.58

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