2 article(s) from Petersen, Dirch H
The standard probe pin configurations A, A’, B and B’ used in the experiments.
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The three sub-probes on an M7PP used for multiplexing during measurements; a) 1357 (20 μm pitch), b...
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The dashed curves show the relative Hall signal ΔRBB′/RH = f(ζ) (Equation 1) and relative pseudo sheet resist...
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Static position errors: at the top, the ideal positions of a M7PP is shown. Below, the case of only...
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Effective sensitivity for a) R0, b) NHS and c) μH when in- and off-line errors are present during ...
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Effective sensitivity for the sheet resistance, Hall mobility and Hall sheet carrier density, due ...
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Generalization of Figure 6. The sensitivity of each parameter, a) Sheet resistance R0, b) Sheet carrier den...
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Beilstein J. Nanotechnol. 2018, 9, 2032–2039, doi:10.3762/bjnano.9.192
Top-view schematic of the four μ4pp electrodes landed on (a) a single fin and (b) two fins. The ele...
(a) Measured fin resistance Rfin as a function of fin width Wfin on isolated (triangle) and dense (...
(a) TEM image of four ca. 20 nm wide Si fins where the measured Rfin is indicated on top of each fi...
Beilstein J. Nanotechnol. 2018, 9, 1863–1867, doi:10.3762/bjnano.9.178
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