1 article(s) from Ting, Shao-Ying
Scanning electron microscopy images of the anodic aluminum oxide (AAO) nanostructure on a sapphire ...
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Atomic force microscopy measurements for samples (a–c) AAO60, (d–f) AAO70, and (g–i) AAO80.
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Transmission electron microscopy measurements for sample AAO60 at different magnifications: (a) com...
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Transmission electron microscopy measurements for sample AAO70 obtained at different magnifications...
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Transmission electron microscopy measurements for AAO80 obtained at different magnifications: (a) c...
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(a) Measured luminous wavelength versus energy and (b) luminous angle for samples AAO60, AAO70, AAO...
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(a) Angle-resolved electroluminescence (AREL) spectra of samples FC-BLED and AAO70. Angular resolut...
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Typical light output power–current–voltage (L–I–V) curves of the samples in this study.
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Sample structure used in rigorous coupled-wave analysis (RCWA) calculations: (a) AAO sample structu...
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Rigorous coupled-wave analysis (RCWA) results obtained with different Al2O3 thickness and air-hole ...
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Rigorous coupled-wave analysis (RCWA) results with different Al thickness values and fixed Al2O3 th...
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Structure of flip-chip LED with anodic aluminum oxide (AAO) processing.
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Beilstein J. Nanotechnol. 2018, 9, 1602–1612, doi:10.3762/bjnano.9.152
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