3 article(s) from Winkler, Robert
- Full Research Paper
- Published 15 Nov 2017
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Figure 1: (a) Representative FEBID deposit created from cis-Pt(CO)2Cl2. Representative AES and EDS of “as-dep...
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Figure 2: (a) SEM image of a deposit created from cis-Pt(CO)2Cl2, and (b) corresponding EDS spectrum. (c) SEM...
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Figure 3: (a) PtCl2 deposit created from cis-Pt(CO)2Cl2; (b) corresponding EDS analysis. (c) SEM image of the...
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Figure 4: (a) SEM image of a PtCl2 deposit created from cis-Pt(CO)2Cl2, without any EDS analysis and prior to...
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Figure 5: SEM images of a deposit created from cis-Pt(CO)2Cl2: (a) prior to any treatment, and after (b) 48, ...
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Figure 6: AES for a deposit created from cis-Pt(CO)2Cl2 (top spectrum) and then subjected to alternating trea...
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Figure 7: AFM data for nanostructures created from MeCpPtMe3 using different total exposure times (TET) (per ...
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Figure 8: (a) Height of nanostructures created from MeCpPtMe3 as determined by AFM: as-deposited (black bar) ...
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Scheme 1: Hess cycle for electron purification of PtCl2. ∆H = −∆Hf PtCl2 + Cl2 bond dissociation enthalpy (BD...
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Scheme 2: Hess cycle for atomic hydrogen purification of PtCl2. ∆H = −∆Hf PtCl2 + H2 bond dissociation enthal...
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- Full Research Paper
- Published 07 Apr 2017
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Figure 1: Schematic illustrating the experimental system which includes a laser delivery system, precursor an...
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Figure 2: Segment angle plotted as a function of dwell time per pixel grown under six different conditions: 1...
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Figure 3: BF STEM images of a) an as-deposited EBID segment with a 10.4 ms dwell time per pixel and in situ L...
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Figure 4: SEM images (scale bar length is 100 nm) of suspended nanowires grown across a ≈500 nm gap using a d...
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Figure 5: COMSOL™ simulation results showing the preferential heating at of the EBID deposit. a) is a plot of...
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- Full Research Paper
- Published 16 Feb 2015
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Figure 1: (a) Classification of proximal shapes (right hand side). The grey box indicates the intended deposi...
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Figure 2: (a) Radius of the outer halo (AFM-based) of 30 keV PtC deposits as a function of the central pad th...
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Figure 3: Representative AFM height image (a) of a 9 nm thick PtC deposit on Si–SiO2 fabricated at 25 keV tog...
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Figure 4: AFM height images with overlaid current information of PtC pads deposited on an conductive Au elect...
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Figure 5: (a) Functional classification of proximity deposition based on KFM measurements. (b) and (c) show t...
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Figure 6: Edge-broadening effect for 30 keV deposits of different thickness. (a) shows a normalized height re...
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Figure 7: Broadening effects for 5 keV deposits of different thickness. (b) shows the normalized height repre...
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Figure 8: Outer-halo behavior for increasing pad thicknesses of 5 keV deposits (squares) together with an FSE...
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Figure 9: (a) AFM height cross section of a 20 keV deposit. (b) cumulative BSE emission (blue, left axis) and...
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