7 article(s) from Wirtz, Tom
- Full Research Paper
- Published 11 Dec 2020
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Figure 1: (a) Schematic representation of the STIM experiment. (b) Picture of the inner part of the chamber. ...
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Figure 2: Micrographs of lacey carbon on carbon film. (a) Secondary electron imaging mode, (b) bright-field S...
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Figure 3: Bright-field image showing contrast due to the dependence of the exit angle on the material and the...
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Figure 4: Helium ion microscopy images of the nanoporous polycrystalline silicon membrane. (a) SE image. (b) ...
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Figure 5: Thallium chloride evaporated on a TEM grid. (a) Secondary electron image. Inset of (a) shows the re...
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Figure 6: STIM images of a single-crystalline silicon ⟨100⟩ membrane in (a) bright-field with θ ≤ 1.09°, and ...
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- Full Research Paper
- Published 07 Aug 2019
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Figure 1: Schematic of the transmission helium ion microscope (THIM).
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Figure 2: For a BN sample, the voltage of Lens 2 was decreased from (A) to (E). A) A shadow image, B) a highe...
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Figure 3: Examples of overfocus bright outline deflection patterns (A and D), underfocus spot patterns (B and...
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Figure 4: A) HIM SE image with charge compensation by electron flooding and B) HIM SE image without charge co...
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Figure 5: A) A THIM through-focus series of the MgO sample (coated with 10 nm Au on both sides) produced by d...
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- Full Research Paper
- Published 09 Jul 2018
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Figure 1: Raman spectra of multiwalled carbon nanotubes after irradiation with different fluences of a) 25 ke...
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Figure 2: a) Ratio of intensities of D to G band as a function of fluence for 25 keV He and Ne irradiation, a...
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Figure 3: TEM images and Raman spectra after: (A–C) 25 keV He+ irradiation with a fluence of 1018 ions/cm2 (D...
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Figure 4: Nuclear and electronic energy loss as a function of sample thickness for a) He+ and b) Ne+ irradiat...
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Figure 5: Sputter yield a) at the top, and b) at the bottom of the sample as a function of fluence for Ne irr...
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Figure 6: Backscatter yield as a function of gold thickness for He and Ne irradiation of a 30 nm carbon film ...
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Figure 7: Displacements into the carbon layer normalised to incident ion as a function of gold thickness for ...
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Figure 8: Schematic illustration of the sample configuration and the sequence of techniques used in this inve...
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- Full Research Paper
- Published 17 Nov 2016
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Figure 1: Initial sample composition for a) sample #1, b) sample #2, and c) sample #3. All samples have inter...
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Figure 2: Sample composition as a function of depth and primary ion fluence for 1 keV He+ irradiation of samp...
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Figure 3: Sample composition as a function of depth and primary ion fluence for 1 keV He+ irradiation of samp...
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Figure 4: Sample composition as a function of depth and primary ion fluence for 20 keV Ne+ irradiation of sam...
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Figure 5: Sample composition as a function of depth and primary ion fluence for 20 keV Ar+ irradiation of sam...
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Figure 6: Simulated depth profiles for a) 20 keV Ne+ irradiation of sample #1 with 10 nm and 20 nm inter-laye...
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Figure 7: Sample composition as a function of depth and primary ion fluence for 1 keV Ne+ irradiation of samp...
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Figure 8: Sample composition as a function of depth and primary ion fluence for 1 keV Ne+ irradiation of samp...
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Figure 9: Simulated depth profiles for a) 1 keV Ne+ irradiation of sample #1, b) 1 keV Ne+ irradiation of sam...
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Figure 10: Simulated depth profiles for a) 1 keV Ne+ irradiation of sample #2, b) 1 keV Ar+ irradiation of sam...
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- Full Research Paper
- Published 02 Aug 2016
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Figure 1: Changing topography of PMMA bombarded by 5.5 keV Ne+ as a function of fluence (FOV: 1 × 1 µm2).
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Figure 2: RMS roughness changing with primary He+ and Ne+ fluence when bombarding (a) PMMA and (b) PS.
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Figure 3: Displacement of He, Ne and Ar from their initial positions in HD-PMMA sample at 300 K. No periodic ...
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Figure 4: Mean square displacement (MSD) of helium, neon and argon at 300 K in a) HD-PE, b) HD-PS, c) HD-PMMA...
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Figure 5: Implantation profiles in polyethylene obtained by SD_TRIM_SP for diffusion coefficient ranging from...
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Figure 6: Surface sputtering vs swelling for different diffusion coefficients for helium irradiation of PE.
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Figure 7: Evolution of sputter yields with fluence for a) helium, b) neon, and c) argon bombardment of PE at ...
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Figure 8: Evolution of sputter yields with fluence for a) helium, b) neon, and c) argon bombardment of PTFE a...
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Figure 9: Evolution of sputter yields with fluence for a) helium, b) neon, and c) argon bombardment of PMMA a...
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Figure 10: Partial sputter yields for the different chemical elements sputtered from a) PTFE, b) PE, c) PMMA, ...
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Figure 11: Surface composition as a function of impact energy for helium, neon and argon bombardment of a) F a...
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Figure 12: Concentration profiles of F and C at a fluence of 1018 ions/cm2 for He, Ne and Ar bombardment of PT...
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Figure 13: Concentration profiles of H and C at a fluence of 1018 ions/cm2 for He, Ne and Ar bombardment of PE...
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- Full Research Paper
- Published 30 Apr 2015
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Figure 1: PVP/PS polymer blend after Cs+ bombardment of 1.02 × 1016 ions/cm2: The SIMS recorded secondary ion...
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Figure 2: 52Cr16O− (a) and 27Al16O− (b) secondary ion intensity recorded by the NanoSIMS instrument during th...
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Figure 3: Snapshot of SIMS-SPM reconstructed surface before (a) and during (b) SIMS analysis performed on Ti(...
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Figure 4: Chemical image showing the 12C2− secondary ion intensity recorded from the TaN reticule with a 10 n...
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Figure 5: 2D mapping of 24Mg16O− secondary ion signal summed over analysis depth (a). 3D volume reconstructio...
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