1 article(s) from Zheng, Lei
- Full Research Paper
- Published 07 Aug 2019
-
PDF -
Album-
![]()
Figure 1: (a) Schematic illustration of CR-AFM imaging on the flexible circuit sample. (b) An enlarged sectio...
-
![]()
Figure 2: Subsurface imaging of the flexible circuit sample with a top layer thickness of 52 nm measured via ...
-
![]()
Figure 3: Influence of the applied force on CR-AFM subsurface imaging of the flexible circuit sample with a 5...
-
![]()
Figure 4: Influence of cantilever stiffness on CR-AFM subsurface imaging of the flexible circuit sample with ...
-
![]()
Figure 5: The influence of cantilever oscillation eigenmode on CR-AFM subsurface imaging of a flexible circui...
-
![]()
Figure 6: Influence of cover thickness on CR-AFM subsurface imaging of the circuit sample. (a–e) Frequency im...
-
![]()
Figure 7: Influence of thickness and material properties of each layer on subsurface imaging of the circuit p...
-
![]()
Figure 8: Optimization of CR-AFM subsurface imaging on a flexible circuit sample. (a,b) CR-AFM frequency imag...
-
![]()
Figure 9: Subsurface imaging of defects in the buried circuit pattern using CR-AFM. (a) Schematic illustratio...
-
