1 article(s) from van Treeck, David
(a) Cross-sectional micrograph of the investigated self-assembled GaN NW LEDs on Si acquired in the...
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The colored spectra (normalized) represent the EL measured with the probe tip at four different pos...
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(a) EL spectra of NW C for currents in the range of 10–400 nA. The inset shows the corresponding cu...
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(a) Normalized EL spectra at various measurement points, including NW C for a driving current of 10...
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(a) I–V characteristic of points C, E, F, and G. The dashed line shows an example for a linear fit ...
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(a) Integrated EL and (b) normalized relative EQE of the measurement points C, E, F, and G as a fun...
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Beilstein J. Nanotechnol. 2019, 10, 1177–1187, doi:10.3762/bjnano.10.117
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