TY - JOUR A1 - Mascaro, Aaron A1 - Miyahara, Yoichi A1 - Enright, Tyler A1 - Dagdeviren, Omur E. A1 - Grütter, Peter T1 - Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements JF - Beilstein Journal of Nanotechnology PY - 2019/// VL - 10 SP - 617 EP - 633 SN - 2190-4286 DO - 10.3762/bjnano.10.62 PB - Beilstein-Institut JA - Beilstein J. Nanotechnol. UR - https://doi.org/10.3762/bjnano.10.62 KW - atomic force microscopy KW - electrostatic force microscopy KW - ionic transport KW - lithium ion batteries KW - nanotechnology N2 - Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established. ER -