Take a look at the many thematic issues that we've published on the topic of AFM with hundreds of contributions!

Published issues:

Scanning probe microscopy for energy-related materials
Editors: Prof. Philippe Leclère / Dr. Rüdiger Berger / Dr. Benjamin Grévin / Dr. Yi Zhang

Advanced atomic force microscopy II
Editors: Dr. Milica Todorovic / Prof. Mehmet Z. Baykara / Dr. Thilo Glatzel

Advanced atomic force microscopy
Editors: Dr. Thilo Glatzel / Prof. Mehmet Z. Baykara / Prof. Udo D. Schwarz / Prof. Ricardo Garcia

Advanced atomic force microscopy techniques IV
Editor: Dr. Thilo Glatzel

Noncontact atomic force microscopy III
Editors: Prof. Mehmet Z. Baykara / Prof. Udo D. Schwarz

17 Jun 2020