To gain a deeper understanding of a material and to answer specific questions concerning the properties of a material, more than one method to prepare, modify and analyze a sample is often needed. Furthermore, a clear localization of the analyzed area within the sample is necessary, especially when a sample is analyzed using different instruments.
New instruments and software tools are needed to enable such correlative investigations and to extend the capabilities of materials science.
The aim of this issue is to collect publications that show new results of such correlative approaches on the micrometer and nanometer scales. Further publications describing new techniques and workflows in the area of correlative characterization, manipulation and preparation of samples are of interest. Reviews giving an overview of already existing correlative approaches will complement this thematic issue. Studies that focus on data science aspects of the correlative approaches (i.e., automated image analysis; combination, representation and automated interpretation of results achieved with different instruments and methods or the description of metadata; instrumentation) are also welcome.
The submitted works to this thematic issue may include, but are not limited to the following topics:
** Submission deadline extended to February 28, 2023 **