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Noncontact atomic force microscopy II


Editors: Prof. Mehmet Z. Baykara1 and Prof. Udo D. Schwarz2
1Bilkent University and 2Yale University

This is the second Thematic Series on noncontact atomic force microscopy (NC-AFM). It follows the first serieslaunched in 2012. Since its introduction two decades ago, NC-AFM has been used to image a large number of conducting, semi-conducting, and insulating material surfaces of technological and scientific importance with atomic resolution, thus contributing to nanoscale science in a major way with each passing year. The capabilities of NC-AFM are not only limited to atomic-resolution imaging: Force spectroscopy allows characterization of interatomic forces with unprecedented resolution in three spatial dimensions, while manipulation experiments at both low temperatures and room temperature have demonstrated the capability of the technique to controllably construct atomicscale structures on surfaces. This Thematic Series provides an overview of the current state-of-the-art in NC-AFM research, thereby delivering a snapshot of the newest trends in the field.

See also the Thematic Series:
Noncontact atomic force microscopy III

Noncontact atomic force microscopy

Advanced atomic force microscopy techniques IV



 
Overview

Noncontact atomic force microscopy II

Mehmet Z. Baykara, Udo D. Schwarz

Beilstein J. Nanotechnol. 2014, 5, 289–290. published 12 Mar 2014

Editorial

Structural development and energy dissipation in simulated silicon apices

Samuel Paul Jarvis, Lev Kantorovich, Philip Moriarty

Beilstein J. Nanotechnol. 2013, 4, 941–948. published 20 Dec 2013

Full Research Paper

Noise performance of frequency modulation Kelvin force microscopy

Heinrich Diesinger, Dominique Deresmes, Thierry Mélin

Beilstein J. Nanotechnol. 2014, 5, 1–18. published 02 Jan 2014

Full Research Paper

Influence of the adsorption geometry of PTCDA on Ag(111) on the tip–molecule forces in non-contact atomic force microscopy

Gernot Langewisch, Jens Falter, André Schirmeisen, Harald Fuchs

Beilstein J. Nanotechnol. 2014, 5, 98–104. published 27 Jan 2014

Full Research Paper

The role of surface corrugation and tip oscillation in single-molecule manipulation with a non-contact atomic force microscope

Christian Wagner, Norman Fournier, F. Stefan Tautz, Ruslan Temirov

Beilstein J. Nanotechnol. 2014, 5, 202–209. published 26 Feb 2014

Full Research Paper

Unlocking higher harmonics in atomic force microscopy with gentle interactions

Sergio Santos, Victor Barcons, Josep Font, Albert Verdaguer

Beilstein J. Nanotechnol. 2014, 5, 268–277. published 11 Mar 2014

Full Research Paper

Frequency, amplitude, and phase measurements in contact resonance atomic force microscopies

Gheorghe Stan, Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 278–288. published 12 Mar 2014

Full Research Paper

Effect of contaminations and surface preparation on the work function of single layer MoS2

Oliver Ochedowski, Kolyo Marinov, Nils Scheuschner, Artur Poloczek, Benedict Kleine Bussmann, Janina Maultzsch, Marika Schleberger

Beilstein J. Nanotechnol. 2014, 5, 291–297. published 13 Mar 2014

Full Research Paper

Challenges and complexities of multifrequency atomic force microscopy in liquid environments

Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 298–307. published 14 Mar 2014

Full Research Paper

Exploring the complex mechanical properties of xanthan scaffolds by AFM-based force spectroscopy

Hao Liang, Guanghong Zeng, Yinli Li, Shuai Zhang, Huiling Zhao, Lijun Guo, Bo Liu, Mingdong Dong

Beilstein J. Nanotechnol. 2014, 5, 365–373. published 27 Mar 2014

Full Research Paper

Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces

Adam Sweetman, Andrew Stannard

Beilstein J. Nanotechnol. 2014, 5, 386–393. published 01 Apr 2014

Full Research Paper

Energy dissipation in multifrequency atomic force microscopy

Valentina Pukhova, Francesco Banfi, Gabriele Ferrini

Beilstein J. Nanotechnol. 2014, 5, 494–500. published 17 Apr 2014

Full Research Paper

Calibration of quartz tuning fork spring constants for non-contact atomic force microscopy: direct mechanical measurements and simulations

Jens Falter, Marvin Stiefermann, Gernot Langewisch, Philipp Schurig, Hendrik Hölscher, Harald Fuchs, André Schirmeisen

Beilstein J. Nanotechnol. 2014, 5, 507–516. published 23 Apr 2014

Full Research Paper