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Noncontact atomic force microscopy III

Editors: Prof. Mehmet Z. Baykara, Bilkent University and 
Prof. Udo D. Schwarz, Yale University

The method of noncontact atomic force microscopy (NC-AFM) has evolved significantly since its introduction and it is now possible to employ the technique to visualize the internal structure of individual molecules, controllably manipulate single atoms on surfaces, and measure potential energy landscapes with unprecedented resolution. Moreover, NC-AFM is not only limited to operation under ultrahigh vacuum and it can now be utilized to study the detailed structure and even the dynamic activity of biological molecules.

This Thematic Series follows the series "Noncontact atomic force microscopy" and "Noncontact atomic force microscopy II".


Noncontact atomic force microscopy III

Mehmet Z. Baykara, Udo D. Schwarz

Beilstein J. Nanotechnol. 2016, 7, 946–947. published 30 Jun 2016


Boosting the local anodic oxidation of silicon through carbon nanofiber atomic force microscopy probes

Gemma Rius, Matteo Lorenzoni, Soichiro Matsui, Masaki Tanemura, Francesc Perez-Murano

Beilstein J. Nanotechnol. 2015, 6, 215–222. published 19 Jan 2015

Full Research Paper

A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

Tobias Meier, Alexander Förste, Ali Tavassolizadeh, Karsten Rott, Dirk Meyners, Roland Gröger, Günter Reiss, Eckhard Quandt, Thomas Schimmel, Hendrik Hölscher

Beilstein J. Nanotechnol. 2015, 6, 451–461. published 13 Feb 2015

Full Research Paper

Improved atomic force microscopy cantilever performance by partial reflective coating

Zeno Schumacher, Yoichi Miyahara, Laure Aeschimann, Peter Grütter

Beilstein J. Nanotechnol. 2015, 6, 1450–1456. published 03 Jul 2015

Full Research Paper

A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy

Santiago D. Solares

Beilstein J. Nanotechnol. 2015, 6, 2233–2241. published 26 Nov 2015

Full Research Paper

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

Urs Gysin, Thilo Glatzel, Thomas Schmölzer, Adolf Schöner, Sergey Reshanov, Holger Bartolf, Ernst Meyer

Beilstein J. Nanotechnol. 2015, 6, 2485–2497. published 28 Dec 2015

Full Research Paper

Efficiency improvement in the cantilever photothermal excitation method using a photothermal conversion layer

Natsumi Inada, Hitoshi Asakawa, Taiki Kobayashi, Takeshi Fukuma

Beilstein J. Nanotechnol. 2016, 7, 409–417. published 10 Mar 2016

Full Research Paper

Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air

Hannes Beyer, Tino Wagner, Andreas Stemmer

Beilstein J. Nanotechnol. 2016, 7, 432–438. published 15 Mar 2016

Full Research Paper

Modelling of ‘sub-atomic’ contrast resulting from back-bonding on Si(111)-7×7

Adam Sweetman, Samuel P. Jarvis, Mohammad A. Rashid

Beilstein J. Nanotechnol. 2016, 7, 937–945. published 29 Jun 2016

Full Research Paper

Noise in NC-AFM measurements with significant tip–sample interaction

Jannis Lübbe, Matthias Temmen, Philipp Rahe, Michael Reichling

Beilstein J. Nanotechnol. 2016, 7, 1885–1904. published 01 Dec 2016

Full Research Paper