Noncontact atomic force microscopy II

  1. editorImage
  1. Editors: Prof. Mehmet Z. Baykara1 and Prof. Udo D. Schwarz2
    1Bilkent University and 2Yale University

This is the second Thematic Series on noncontact atomic force microscopy (NC-AFM). It follows the first serieslaunched in 2012. Since its introduction two decades ago, NC-AFM has been used to image a large number of conducting, semi-conducting, and insulating material surfaces of technological and scientific importance with atomic resolution, thus contributing to nanoscale science in a major way with each passing year. The capabilities of NC-AFM are not only limited to atomic-resolution imaging: Force spectroscopy allows characterization of interatomic forces with unprecedented resolution in three spatial dimensions, while manipulation experiments at both low temperatures and room temperature have demonstrated the capability of the technique to controllably construct atomicscale structures on surfaces. This Thematic Series provides an overview of the current state-of-the-art in NC-AFM research, thereby delivering a snapshot of the newest trends in the field.

See also the Thematic Series:
Noncontact atomic force microscopy III

Noncontact atomic force microscopy

Advanced atomic force microscopy techniques IV

Noncontact atomic force microscopy II

  1. Mehmet Z. Baykara and
  2. Udo D. Schwarz
  • Editorial
  • Published 12 Mar 2014

Beilstein J. Nanotechnol. 2014, 5, 289–290, doi:10.3762/bjnano.5.31

Structural development and energy dissipation in simulated silicon apices

  1. Samuel Paul Jarvis,
  2. Lev Kantorovich and
  3. Philip Moriarty
  • Full Research Paper
  • Published 20 Dec 2013

  • PDF

Beilstein J. Nanotechnol. 2013, 4, 941–948, doi:10.3762/bjnano.4.106

Noise performance of frequency modulation Kelvin force microscopy

  1. Heinrich Diesinger,
  2. Dominique Deresmes and
  3. Thierry Mélin
  • Full Research Paper
  • Published 02 Jan 2014

  • PDF

Beilstein J. Nanotechnol. 2014, 5, 1–18, doi:10.3762/bjnano.5.1

  • Full Research Paper
  • Published 27 Jan 2014

  • PDF

Beilstein J. Nanotechnol. 2014, 5, 98–104, doi:10.3762/bjnano.5.9

  • Full Research Paper
  • Published 26 Feb 2014

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2014, 5, 202–209, doi:10.3762/bjnano.5.22

Unlocking higher harmonics in atomic force microscopy with gentle interactions

  1. Sergio Santos,
  2. Victor Barcons,
  3. Josep Font and
  4. Albert Verdaguer
  • Full Research Paper
  • Published 11 Mar 2014

  • PDF

Beilstein J. Nanotechnol. 2014, 5, 268–277, doi:10.3762/bjnano.5.29

  • Full Research Paper
  • Published 12 Mar 2014

  • PDF

Beilstein J. Nanotechnol. 2014, 5, 278–288, doi:10.3762/bjnano.5.30

Effect of contaminations and surface preparation on the work function of single layer MoS2

  1. Oliver Ochedowski,
  2. Kolyo Marinov,
  3. Nils Scheuschner,
  4. Artur Poloczek,
  5. Benedict Kleine Bussmann,
  6. Janina Maultzsch and
  7. Marika Schleberger
  • Full Research Paper
  • Published 13 Mar 2014

  • PDF

Beilstein J. Nanotechnol. 2014, 5, 291–297, doi:10.3762/bjnano.5.32

  • Full Research Paper
  • Published 14 Mar 2014

  • PDF

Beilstein J. Nanotechnol. 2014, 5, 298–307, doi:10.3762/bjnano.5.33

Exploring the complex mechanical properties of xanthan scaffolds by AFM-based force spectroscopy

  1. Hao Liang,
  2. Guanghong Zeng,
  3. Yinli Li,
  4. Shuai Zhang,
  5. Huiling Zhao,
  6. Lijun Guo,
  7. Bo Liu and
  8. Mingdong Dong
  • Full Research Paper
  • Published 27 Mar 2014

  • PDF

Beilstein J. Nanotechnol. 2014, 5, 365–373, doi:10.3762/bjnano.5.42

  • Full Research Paper
  • Published 01 Apr 2014

  • PDF

Beilstein J. Nanotechnol. 2014, 5, 386–393, doi:10.3762/bjnano.5.45

Energy dissipation in multifrequency atomic force microscopy

  1. Valentina Pukhova,
  2. Francesco Banfi and
  3. Gabriele Ferrini
  • Full Research Paper
  • Published 17 Apr 2014

  • PDF

  • Correction

Beilstein J. Nanotechnol. 2014, 5, 494–500, doi:10.3762/bjnano.5.57

Calibration of quartz tuning fork spring constants for non-contact atomic force microscopy: direct mechanical measurements and simulations

  1. Jens Falter,
  2. Marvin Stiefermann,
  3. Gernot Langewisch,
  4. Philipp Schurig,
  5. Hendrik Hölscher,
  6. Harald Fuchs and
  7. André Schirmeisen
  • Full Research Paper
  • Published 23 Apr 2014

  • PDF

Beilstein J. Nanotechnol. 2014, 5, 507–516, doi:10.3762/bjnano.5.59

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