Noncontact atomic force microscopy III

  1. editorImage
  1. Editors: Prof. Mehmet Z. Baykara, Bilkent University and 
    Prof. Udo D. Schwarz, Yale University

The method of noncontact atomic force microscopy (NC-AFM) has evolved significantly since its introduction and it is now possible to employ the technique to visualize the internal structure of individual molecules, controllably manipulate single atoms on surfaces, and measure potential energy landscapes with unprecedented resolution. Moreover, NC-AFM is not only limited to operation under ultrahigh vacuum and it can now be utilized to study the detailed structure and even the dynamic activity of biological molecules.

This Thematic Series follows the series "Noncontact atomic force microscopy" and "Noncontact atomic force microscopy II".

Noncontact atomic force microscopy III

  1. Mehmet Z. Baykara and
  2. Udo D. Schwarz
  • Editorial
  • Published 30 Jun 2016

Beilstein J. Nanotechnol. 2016, 7, 946–947, doi:10.3762/bjnano.7.86

Boosting the local anodic oxidation of silicon through carbon nanofiber atomic force microscopy probes

  1. Gemma Rius,
  2. Matteo Lorenzoni,
  3. Soichiro Matsui,
  4. Masaki Tanemura and
  5. Francesc Perez-Murano
  • Full Research Paper
  • Published 19 Jan 2015

  • PDF

Beilstein J. Nanotechnol. 2015, 6, 215–222, doi:10.3762/bjnano.6.20

A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

  1. Tobias Meier,
  2. Alexander Förste,
  3. Ali Tavassolizadeh,
  4. Karsten Rott,
  5. Dirk Meyners,
  6. Roland Gröger,
  7. Günter Reiss,
  8. Eckhard Quandt,
  9. Thomas Schimmel and
  10. Hendrik Hölscher
  • Full Research Paper
  • Published 13 Feb 2015

  • PDF

  • Video

Beilstein J. Nanotechnol. 2015, 6, 451–461, doi:10.3762/bjnano.6.46

Improved atomic force microscopy cantilever performance by partial reflective coating

  1. Zeno Schumacher,
  2. Yoichi Miyahara,
  3. Laure Aeschimann and
  4. Peter Grütter
  • Full Research Paper
  • Published 03 Jul 2015

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2015, 6, 1450–1456, doi:10.3762/bjnano.6.150

  • Full Research Paper
  • Published 26 Nov 2015

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2015, 6, 2233–2241, doi:10.3762/bjnano.6.229

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

  1. Urs Gysin,
  2. Thilo Glatzel,
  3. Thomas Schmölzer,
  4. Adolf Schöner,
  5. Sergey Reshanov,
  6. Holger Bartolf and
  7. Ernst Meyer
  • Full Research Paper
  • Published 28 Dec 2015

  • PDF

Beilstein J. Nanotechnol. 2015, 6, 2485–2497, doi:10.3762/bjnano.6.258

  • Full Research Paper
  • Published 10 Mar 2016

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2016, 7, 409–417, doi:10.3762/bjnano.7.36

  • Full Research Paper
  • Published 15 Mar 2016

  • PDF

Beilstein J. Nanotechnol. 2016, 7, 432–438, doi:10.3762/bjnano.7.38

Modelling of ‘sub-atomic’ contrast resulting from back-bonding on Si(111)-7×7

  1. Adam Sweetman,
  2. Samuel P. Jarvis and
  3. Mohammad A. Rashid
  • Full Research Paper
  • Published 29 Jun 2016

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2016, 7, 937–945, doi:10.3762/bjnano.7.85

Noise in NC-AFM measurements with significant tip–sample interaction

  1. Jannis Lübbe,
  2. Matthias Temmen,
  3. Philipp Rahe and
  4. Michael Reichling
  • Full Research Paper
  • Published 01 Dec 2016

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2016, 7, 1885–1904, doi:10.3762/bjnano.7.181

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