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Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis

Omur E. Dagdeviren1,2 and Udo D. Schwarz1,2,3
1Department of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06520, USA
2Center for Research on Interface Structures and Phenomena (CRISP), Yale University, New Haven, CT 06520, USA
3Department of Chemical and Environmental Engineering, Yale University, New Haven, CT 06520, USA
Email of corresponding author Corresponding author email     
This article is part of the Thematic Series "Advanced atomic force microscopy".
Guest Editor: T. Glatzel
Beilstein J. Nanotechnol. 2017, 8, 657–666.
doi:10.3762/bjnano.8.70

Article Information

 
 
 
 
  • 2190-4286-8-70-1
  • 2190-4286-8-70-2
  • 2190-4286-8-70-3
  • 2190-4286-8-70-4
  • 2190-4286-8-70-5
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  • 2190-4286-8-70-graphical-abstract
2190-4286-8-70-12190-4286-8-70-22190-4286-8-70-32190-4286-8-70-42190-4286-8-70-52190-4286-8-70-62190-4286-8-70-graphical-abstract
© 2017 Dagdeviren and Schwarz; licensee Beilstein-Institut.
This is an Open Access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (http://www.beilstein-journals.org/bjnano)