Advanced atomic force microscopy
Dr. Thilo Glatzel, University of Basel
Prof. Mehmet Z. Baykara, Bilkent University
Prof. Udo D. Schwarz, Yale University
Prof. Ricardo Garcia, Instituto de Ciencia de Materiales de Madrid
This thematic issue presents research results in atomic force microscopy and consists of one review and 21 full research papers. Contributions to this issue come from an international group of noted experts.
See related thematic issues:
Advanced atomic force microscopy II
Advanced atomic force microscopy techniques IV
Advanced atomic force microscopy techniques III
Advanced atomic force microscopy techniques II
Advanced atomic force microscopy techniques
Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement
- Steven Ian Moore,
- Michael G. Ruppert and
- Yuen Kuan Yong
Beilstein J. Nanotechnol. 2017, 8, 358–371, doi:10.3762/bjnano.8.38
Analysis and modification of defective surface aggregates on PCDTBT:PCBM solar cell blends using combined Kelvin probe, conductive and bimodal atomic force microscopy
- Hanaul Noh,
- Alfredo J. Diaz and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2017, 8, 579–589, doi:10.3762/bjnano.8.62
Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis
- Omur E. Dagdeviren and
- Udo D. Schwarz
Beilstein J. Nanotechnol. 2017, 8, 657–666, doi:10.3762/bjnano.8.70
Calculating free energies of organic molecules on insulating substrates
- Julian Gaberle,
- David Z. Gao and
- Alexander L. Shluger
Beilstein J. Nanotechnol. 2017, 8, 667–674, doi:10.3762/bjnano.8.71
Measuring adhesion on rough surfaces using atomic force microscopy with a liquid probe
- Juan V. Escobar,
- Cristina Garza and
- Rolando Castillo
Beilstein J. Nanotechnol. 2017, 8, 813–825, doi:10.3762/bjnano.8.84
Functional dependence of resonant harmonics on nanomechanical parameters in dynamic mode atomic force microscopy
- Federico Gramazio,
- Matteo Lorenzoni,
- Francesc Pérez-Murano,
- Enrique Rull Trinidad,
- Urs Staufer and
- Jordi Fraxedas
Beilstein J. Nanotechnol. 2017, 8, 883–891, doi:10.3762/bjnano.8.90
Scaling law to determine peak forces in tapping-mode AFM experiments on finite elastic soft matter systems
- Horacio V. Guzman
Beilstein J. Nanotechnol. 2017, 8, 968–974, doi:10.3762/bjnano.8.98
A review of demodulation techniques for amplitude-modulation atomic force microscopy
- Michael G. Ruppert,
- David M. Harcombe,
- Michael R. P. Ragazzon,
- S. O. Reza Moheimani and
- Andrew J. Fleming
Beilstein J. Nanotechnol. 2017, 8, 1407–1426, doi:10.3762/bjnano.8.142
High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach
- Juan Ren and
- Qingze Zou
Beilstein J. Nanotechnol. 2017, 8, 1563–1570, doi:10.3762/bjnano.8.158
Air–water interface of submerged superhydrophobic surfaces imaged by atomic force microscopy
- Markus Moosmann,
- Thomas Schimmel,
- Wilhelm Barthlott and
- Matthias Mail
Beilstein J. Nanotechnol. 2017, 8, 1671–1679, doi:10.3762/bjnano.8.167
Evaluation of preparation methods for suspended nano-objects on substrates for dimensional measurements by atomic force microscopy
- Petra Fiala,
- Daniel Göhler,
- Benno Wessely,
- Michael Stintz,
- Giovanni Mattia Lazzerini and
- Andrew Yacoot
Beilstein J. Nanotechnol. 2017, 8, 1774–1785, doi:10.3762/bjnano.8.179
High-stress study of bioinspired multifunctional PEDOT:PSS/nanoclay nanocomposites using AFM, SEM and numerical simulation
- Alfredo J. Diaz,
- Hanaul Noh,
- Tobias Meier and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2017, 8, 2069–2082, doi:10.3762/bjnano.8.207
Material property analytical relations for the case of an AFM probe tapping a viscoelastic surface containing multiple characteristic times
- Enrique A. López-Guerra and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2017, 8, 2230–2244, doi:10.3762/bjnano.8.223
Robust nanobubble and nanodroplet segmentation in atomic force microscope images using the spherical Hough transform
- Yuliang Wang,
- Tongda Lu,
- Xiaolai Li,
- Shuai Ren and
- Shusheng Bi
Beilstein J. Nanotechnol. 2017, 8, 2572–2582, doi:10.3762/bjnano.8.257
Combined scanning probe electronic and thermal characterization of an indium arsenide nanowire
- Tino Wagner,
- Fabian Menges,
- Heike Riel,
- Bernd Gotsmann and
- Andreas Stemmer
Beilstein J. Nanotechnol. 2018, 9, 129–136, doi:10.3762/bjnano.9.15
Anchoring of a dye precursor on NiO(001) studied by non-contact atomic force microscopy
- Sara Freund,
- Antoine Hinaut,
- Nathalie Marinakis,
- Edwin C. Constable,
- Ernst Meyer,
- Catherine E. Housecroft and
- Thilo Glatzel
Beilstein J. Nanotechnol. 2018, 9, 242–249, doi:10.3762/bjnano.9.26
Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy
- David M. Harcombe,
- Michael G. Ruppert,
- Michael R. P. Ragazzon and
- Andrew J. Fleming
Beilstein J. Nanotechnol. 2018, 9, 490–498, doi:10.3762/bjnano.9.47
Tuning adhesion forces between functionalized gold colloidal nanoparticles and silicon AFM tips: role of ligands and capillary forces
- Sven Oras,
- Sergei Vlassov,
- Marta Berholts,
- Rünno Lõhmus and
- Karine Mougin
Beilstein J. Nanotechnol. 2018, 9, 660–670, doi:10.3762/bjnano.9.61
Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films
- Daiki Katsube,
- Hayato Yamashita,
- Satoshi Abo and
- Masayuki Abe
Beilstein J. Nanotechnol. 2018, 9, 686–692, doi:10.3762/bjnano.9.63
Imaging of viscoelastic soft matter with small indentation using higher eigenmodes in single-eigenmode amplitude-modulation atomic force microscopy
- Miead Nikfarjam,
- Enrique A. López-Guerra,
- Santiago D. Solares and
- Babak Eslami
Beilstein J. Nanotechnol. 2018, 9, 1116–1122, doi:10.3762/bjnano.9.103
Artifacts in time-resolved Kelvin probe force microscopy
- Sascha Sadewasser,
- Nicoleta Nicoara and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2018, 9, 1272–1281, doi:10.3762/bjnano.9.119
Electrostatically actuated encased cantilevers
- Benoit X. E. Desbiolles,
- Gabriela Furlan,
- Adam M. Schwartzberg,
- Paul D. Ashby and
- Dominik Ziegler
Beilstein J. Nanotechnol. 2018, 9, 1381–1389, doi:10.3762/bjnano.9.130
