Advanced atomic force microscopy techniques II

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Editors: Dr. Thilo Glatzel and Prof. Thomas Schimmel
University of Basel and Karlsruhe Institute of Technology
 
Surface science and nanotechnology are inherently coupled because of the increased surface-to-volume ratio at the nanometer scale. Most of the exciting and astonishing properties of nanoscale materials are related to certain surface reconstructions and nanoscale geometries. New functionality is achieved by combinations of nanoscale materials or by structuring their surfaces. The unrivaled tools for measurements of all kind of nanoscale properties are scanning probe microscopy (SPM) techniques, which were triggered by the invention of the scanning tunneling microscope (STM) in 1982 and of the atomic force microscope (AFM) in 1986. These tools opened a huge field of nanoscale studies, from metal surfaces and clusters, molecular structures, insulators to liquid and electrochemical environments and even allowed the integration of various SPM techniques into biological and chemical experiments. The second volume of the Thematic Series “Advanced atomic force microscopy techniques”, which is presented here, compiles again exciting developments in nanoscale research.

See also the Thematic Series:
Advanced atomic force microscopy techniques IV

Advanced atomic force microscopy techniques III

Noncontact atomic force microscopy III

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Advanced atomic force microscopy techniques II

  • Thilo Glatzel,
  • Ricardo Garcia and
  • Thomas Schimmel

Beilstein J. Nanotechnol. 2014, 5, 2326–2327, doi:10.3762/bjnano.5.241

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Editorial
Published 03 Dec 2014

AFM as an analysis tool for high-capacity sulfur cathodes for Li–S batteries

  • Renate Hiesgen,
  • Seniz Sörgel,
  • Rémi Costa,
  • Linus Carlé,
  • Ines Galm,
  • Natalia Cañas,
  • Brigitta Pascucci and
  • K. Andreas Friedrich

Beilstein J. Nanotechnol. 2013, 4, 611–624, doi:10.3762/bjnano.4.68

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Published 04 Oct 2013

Routes to rupture and folding of graphene on rough 6H-SiC(0001) and their identification

  • M. Temmen,
  • O. Ochedowski,
  • B. Kleine Bussmann,
  • M. Schleberger,
  • M. Reichling and
  • T. R. J. Bollmann

Beilstein J. Nanotechnol. 2013, 4, 625–631, doi:10.3762/bjnano.4.69

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Published 07 Oct 2013

Site-selective growth of surface-anchored metal-organic frameworks on self-assembled monolayer patterns prepared by AFM nanografting

  • Tatjana Ladnorg,
  • Alexander Welle,
  • Stefan Heißler,
  • Christof Wöll and
  • Hartmut Gliemann

Beilstein J. Nanotechnol. 2013, 4, 638–648, doi:10.3762/bjnano.4.71

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Published 11 Oct 2013

Atomic force microscopy recognition of protein A on Staphylococcus aureus cell surfaces by labelling with IgG–Au conjugates

  • Elena B. Tatlybaeva,
  • Hike N. Nikiyan,
  • Alexey S. Vasilchenko and
  • Dmitri G. Deryabin

Beilstein J. Nanotechnol. 2013, 4, 743–749, doi:10.3762/bjnano.4.84

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Published 11 Nov 2013

Dynamic nanoindentation by instrumented nanoindentation and force microscopy: a comparative review

  • Sidney R. Cohen and
  • Estelle Kalfon-Cohen

Beilstein J. Nanotechnol. 2013, 4, 815–833, doi:10.3762/bjnano.4.93

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Published 29 Nov 2013

Peak forces and lateral resolution in amplitude modulation force microscopy in liquid

  • Horacio V. Guzman and
  • Ricardo Garcia

Beilstein J. Nanotechnol. 2013, 4, 852–859, doi:10.3762/bjnano.4.96

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Published 06 Dec 2013

STM tip-assisted engineering of molecular nanostructures: PTCDA islands on Ge(001):H surfaces

  • Amir A. Ahmad Zebari,
  • Marek Kolmer and
  • Jakub S. Prauzner-Bechcicki

Beilstein J. Nanotechnol. 2013, 4, 927–932, doi:10.3762/bjnano.4.104

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Published 18 Dec 2013

Surface assembly and nanofabrication of 1,1,1-tris(mercaptomethyl)heptadecane on Au(111) studied with time-lapse atomic force microscopy

  • Tian Tian,
  • Burapol Singhana,
  • Lauren E. Englade-Franklin,
  • Xianglin Zhai,
  • T. Randall Lee and
  • Jayne C. Garno

Beilstein J. Nanotechnol. 2014, 5, 26–35, doi:10.3762/bjnano.5.3

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Published 09 Jan 2014

Study of mesoporous CdS-quantum-dot-sensitized TiO2 films by using X-ray photoelectron spectroscopy and AFM

  • Mohamed N. Ghazzal,
  • Robert Wojcieszak,
  • Gijo Raj and
  • Eric M. Gaigneaux

Beilstein J. Nanotechnol. 2014, 5, 68–76, doi:10.3762/bjnano.5.6

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Published 20 Jan 2014

Nanoscale patterning of a self-assembled monolayer by modification of the molecule–substrate bond

  • Cai Shen and
  • Manfred Buck

Beilstein J. Nanotechnol. 2014, 5, 258–267, doi:10.3762/bjnano.5.28

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Published 10 Mar 2014

Control theory for scanning probe microscopy revisited

  • Julian Stirling

Beilstein J. Nanotechnol. 2014, 5, 337–345, doi:10.3762/bjnano.5.38

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Published 21 Mar 2014

Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures

  • Florian Pielmeier,
  • Daniel Meuer,
  • Daniel Schmid,
  • Christoph Strunk and
  • Franz J. Giessibl

Beilstein J. Nanotechnol. 2014, 5, 407–412, doi:10.3762/bjnano.5.48

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Published 04 Apr 2014

The softening of human bladder cancer cells happens at an early stage of the malignancy process

  • Jorge R. Ramos,
  • Joanna Pabijan,
  • Ricardo Garcia and
  • Malgorzata Lekka

Beilstein J. Nanotechnol. 2014, 5, 447–457, doi:10.3762/bjnano.5.52

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Published 10 Apr 2014

Scale effects of nanomechanical properties and deformation behavior of Au nanoparticle and thin film using depth sensing nanoindentation

  • Dave Maharaj and
  • Bharat Bhushan

Beilstein J. Nanotechnol. 2014, 5, 822–836, doi:10.3762/bjnano.5.94

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Published 11 Jun 2014

Trade-offs in sensitivity and sampling depth in bimodal atomic force microscopy and comparison to the trimodal case

  • Babak Eslami,
  • Daniel Ebeling and
  • Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 1144–1151, doi:10.3762/bjnano.5.125

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Published 24 Jul 2014

Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air

  • Santiago D. Solares,
  • Sangmin An and
  • Christian J. Long

Beilstein J. Nanotechnol. 2014, 5, 1637–1648, doi:10.3762/bjnano.5.175

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Published 25 Sep 2014
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Published 26 Sep 2014

Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

  • Stanislav S. Borysov,
  • Daniel Forchheimer and
  • David B. Haviland

Beilstein J. Nanotechnol. 2014, 5, 1899–1904, doi:10.3762/bjnano.5.200

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Published 29 Oct 2014

Dissipation signals due to lateral tip oscillations in FM-AFM

  • Michael Klocke and
  • Dietrich E. Wolf

Beilstein J. Nanotechnol. 2014, 5, 2048–2057, doi:10.3762/bjnano.5.213

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Published 10 Nov 2014

Nanometer-resolved mechanical properties around GaN crystal surface steps

  • Jörg Buchwald,
  • Marina Sarmanova,
  • Bernd Rauschenbach and
  • Stefan G. Mayr

Beilstein J. Nanotechnol. 2014, 5, 2164–2170, doi:10.3762/bjnano.5.225

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Published 19 Nov 2014
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