Advanced atomic force microscopy techniques

editorImage
Editors: Dr. Thilo Glatzel, University of Basel,
and Prof. Udo D. Schwarz, Yale University
 
Atomic force microscopy is the standard tool for nanometer-scale imaging of all types of surfaces in all environments. True atomic resolution was first achieved in the 1990s. The most convincing results, however, were restricted to the so-called noncontact mode in vacuum for a long time, but recent technical developments overcame this limitation, and atomic-resolution imaging is now also a standard in liquids. The invention of the atomic force microscopy triggered the development of a growing number of new scanning probe methods and approaches, ranging from an expansion of the properties that can be mapped to the active manipulation of surfaces and small particles. Nearly every physical effect that influences the tip–sample interaction has been used to improve existing modes and to develop new ones.

See also the Thematic Series:
Advanced atomic force microscopy techniques IV

Advanced atomic force microscopy techniques III

Noncontact atomic force microscopy III

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Advanced atomic force microscopy techniques

  • Thilo Glatzel,
  • Hendrik Hölscher,
  • Thomas Schimmel,
  • Mehmet Z. Baykara,
  • Udo D. Schwarz and
  • Ricardo Garcia

Beilstein J. Nanotechnol. 2012, 3, 893–894, doi:10.3762/bjnano.3.99

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Published 21 Dec 2012

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

  • Mehmet Z. Baykara,
  • Omur E. Dagdeviren,
  • Todd C. Schwendemann,
  • Harry Mönig,
  • Eric I. Altman and
  • Udo D. Schwarz

Beilstein J. Nanotechnol. 2012, 3, 637–650, doi:10.3762/bjnano.3.73

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Published 11 Sep 2012

The memory effect of nanoscale memristors investigated by conducting scanning probe microscopy methods

  • César Moreno,
  • Carmen Munuera,
  • Xavier Obradors and
  • Carmen Ocal

Beilstein J. Nanotechnol. 2012, 3, 722–730, doi:10.3762/bjnano.3.82

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Published 06 Nov 2012

Friction and durability of virgin and damaged skin with and without skin cream treatment using atomic force microscopy

  • Bharat Bhushan,
  • Si Chen and
  • Shirong Ge

Beilstein J. Nanotechnol. 2012, 3, 731–746, doi:10.3762/bjnano.3.83

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Published 08 Nov 2012

Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

  • Blake W. Erickson,
  • Séverine Coquoz,
  • Jonathan D. Adams,
  • Daniel J. Burns and
  • Georg E. Fantner

Beilstein J. Nanotechnol. 2012, 3, 747–758, doi:10.3762/bjnano.3.84

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Published 13 Nov 2012

Effect of spherical Au nanoparticles on nanofriction and wear reduction in dry and liquid environments

  • Dave Maharaj and
  • Bharat Bhushan

Beilstein J. Nanotechnol. 2012, 3, 759–772, doi:10.3762/bjnano.3.85

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Published 15 Nov 2012

Growth behaviour and mechanical properties of PLL/HA multilayer films studied by AFM

  • Cagri Üzüm,
  • Johannes Hellwig,
  • Narayanan Madaboosi,
  • Dmitry Volodkin and
  • Regine von Klitzing

Beilstein J. Nanotechnol. 2012, 3, 778–788, doi:10.3762/bjnano.3.87

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Published 21 Nov 2012

Spring constant of a tuning-fork sensor for dynamic force microscopy

  • Dennis van Vörden,
  • Manfred Lange,
  • Merlin Schmuck,
  • Nico Schmidt and
  • Rolf Möller

Beilstein J. Nanotechnol. 2012, 3, 809–816, doi:10.3762/bjnano.3.90

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Published 29 Nov 2012

Pinch-off mechanism in double-lateral-gate junctionless transistors fabricated by scanning probe microscope based lithography

  • Farhad Larki,
  • Arash Dehzangi,
  • Alam Abedini,
  • Ahmad Makarimi Abdullah,
  • Elias Saion,
  • Sabar D. Hutagalung,
  • Mohd N. Hamidon and
  • Jumiah Hassan

Beilstein J. Nanotechnol. 2012, 3, 817–823, doi:10.3762/bjnano.3.91

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Published 03 Dec 2012

Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

  • Christian Obermair,
  • Marina Kress,
  • Andreas Wagner and
  • Thomas Schimmel

Beilstein J. Nanotechnol. 2012, 3, 824–830, doi:10.3762/bjnano.3.92

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Published 05 Dec 2012

Characterization of the mechanical properties of qPlus sensors

  • Jan Berger,
  • Martin Švec,
  • Martin Müller,
  • Martin Ledinský,
  • Antonín Fejfar,
  • Pavel Jelínek and
  • Zsolt Majzik

Beilstein J. Nanotechnol. 2013, 4, 1–9, doi:10.3762/bjnano.4.1

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Published 02 Jan 2013

Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

  • Julian Stirling and
  • Gordon A. Shaw

Beilstein J. Nanotechnol. 2013, 4, 10–19, doi:10.3762/bjnano.4.2

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Published 08 Jan 2013

Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

  • Jannis Lübbe,
  • Matthias Temmen,
  • Sebastian Rode,
  • Philipp Rahe,
  • Angelika Kühnle and
  • Michael Reichling

Beilstein J. Nanotechnol. 2013, 4, 32–44, doi:10.3762/bjnano.4.4

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Published 17 Jan 2013

Interpreting motion and force for narrow-band intermodulation atomic force microscopy

  • Daniel Platz,
  • Daniel Forchheimer,
  • Erik A. Tholén and
  • David B. Haviland

Beilstein J. Nanotechnol. 2013, 4, 45–56, doi:10.3762/bjnano.4.5

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Published 21 Jan 2013

Towards 4-dimensional atomic force spectroscopy using the spectral inversion method

  • Jeffrey C. Williams and
  • Santiago D. Solares

Beilstein J. Nanotechnol. 2013, 4, 87–93, doi:10.3762/bjnano.4.10

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Published 07 Feb 2013

High-resolution dynamic atomic force microscopy in liquids with different feedback architectures

  • John Melcher,
  • David Martínez-Martín,
  • Miriam Jaafar,
  • Julio Gómez-Herrero and
  • Arvind Raman

Beilstein J. Nanotechnol. 2013, 4, 153–163, doi:10.3762/bjnano.4.15

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Published 27 Feb 2013
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Published 18 Mar 2013

Selective surface modification of lithographic silicon oxide nanostructures by organofunctional silanes

  • Thomas Baumgärtel,
  • Christian von Borczyskowski and
  • Harald Graaf

Beilstein J. Nanotechnol. 2013, 4, 218–226, doi:10.3762/bjnano.4.22

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Published 25 Mar 2013

Determining cantilever stiffness from thermal noise

  • Jannis Lübbe,
  • Matthias Temmen,
  • Philipp Rahe,
  • Angelika Kühnle and
  • Michael Reichling

Beilstein J. Nanotechnol. 2013, 4, 227–233, doi:10.3762/bjnano.4.23

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Published 28 Mar 2013

High-resolution nanomechanical analysis of suspended electrospun silk fibers with the torsional harmonic atomic force microscope

  • Mark Cronin-Golomb and
  • Ozgur Sahin

Beilstein J. Nanotechnol. 2013, 4, 243–248, doi:10.3762/bjnano.4.25

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Published 05 Apr 2013

Polynomial force approximations and multifrequency atomic force microscopy

  • Daniel Platz,
  • Daniel Forchheimer,
  • Erik A. Tholén and
  • David B. Haviland

Beilstein J. Nanotechnol. 2013, 4, 352–360, doi:10.3762/bjnano.4.41

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Published 10 Jun 2013

Optimal geometry for a quartz multipurpose SPM sensor

  • Julian Stirling

Beilstein J. Nanotechnol. 2013, 4, 370–376, doi:10.3762/bjnano.4.43

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Published 17 Jun 2013

Multiple regimes of operation in bimodal AFM: understanding the energy of cantilever eigenmodes

  • Daniel Kiracofe,
  • Arvind Raman and
  • Dalia Yablon

Beilstein J. Nanotechnol. 2013, 4, 385–393, doi:10.3762/bjnano.4.45

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Published 21 Jun 2013

Ni nanocrystals on HOPG(0001): A scanning tunnelling microscope study

  • Michael Marz,
  • Keisuke Sagisaka and
  • Daisuke Fujita

Beilstein J. Nanotechnol. 2013, 4, 406–417, doi:10.3762/bjnano.4.48

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Published 28 Jun 2013

Kelvin probe force microscopy of nanocrystalline TiO2 photoelectrodes

  • Alex Henning,
  • Gino Günzburger,
  • Res Jöhr,
  • Yossi Rosenwaks,
  • Biljana Bozic-Weber,
  • Catherine E. Housecroft,
  • Edwin C. Constable,
  • Ernst Meyer and
  • Thilo Glatzel

Beilstein J. Nanotechnol. 2013, 4, 418–428, doi:10.3762/bjnano.4.49

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Published 01 Jul 2013
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