Advanced atomic force microscopy techniques

  1. editorImage
  1. Editors: Dr. Thilo Glatzel, University of Basel,
    and Prof. Udo D. Schwarz, Yale University

Atomic force microscopy is the standard tool for nanometer-scale imaging of all types of surfaces in all environments. True atomic resolution was first achieved in the 1990s. The most convincing results, however, were restricted to the so-called noncontact mode in vacuum for a long time, but recent technical developments overcame this limitation, and atomic-resolution imaging is now also a standard in liquids. The invention of the atomic force microscopy triggered the development of a growing number of new scanning probe methods and approaches, ranging from an expansion of the properties that can be mapped to the active manipulation of surfaces and small particles. Nearly every physical effect that influences the tip–sample interaction has been used to improve existing modes and to develop new ones.

See also the Thematic Series:
Advanced atomic force microscopy techniques IV

Advanced atomic force microscopy techniques III

Noncontact atomic force microscopy III

Advanced atomic force microscopy techniques

  1. Thilo Glatzel,
  2. Hendrik Hölscher,
  3. Thomas Schimmel,
  4. Mehmet Z. Baykara,
  5. Udo D. Schwarz and
  6. Ricardo Garcia
  • Editorial
  • Published 21 Dec 2012

Beilstein J. Nanotechnol. 2012, 3, 893–894, doi:10.3762/bjnano.3.99

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

  1. Mehmet Z. Baykara,
  2. Omur E. Dagdeviren,
  3. Todd C. Schwendemann,
  4. Harry Mönig,
  5. Eric I. Altman and
  6. Udo D. Schwarz
  • Full Research Paper
  • Published 11 Sep 2012

  • PDF

Beilstein J. Nanotechnol. 2012, 3, 637–650, doi:10.3762/bjnano.3.73

  • Full Research Paper
  • Published 06 Nov 2012

  • PDF

Beilstein J. Nanotechnol. 2012, 3, 722–730, doi:10.3762/bjnano.3.82

  • Full Research Paper
  • Published 08 Nov 2012

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Beilstein J. Nanotechnol. 2012, 3, 731–746, doi:10.3762/bjnano.3.83

Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

  1. Blake W. Erickson,
  2. Séverine Coquoz,
  3. Jonathan D. Adams,
  4. Daniel J. Burns and
  5. Georg E. Fantner
  • Full Research Paper
  • Published 13 Nov 2012

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2012, 3, 747–758, doi:10.3762/bjnano.3.84

  • Full Research Paper
  • Published 15 Nov 2012

  • PDF

Beilstein J. Nanotechnol. 2012, 3, 759–772, doi:10.3762/bjnano.3.85

Growth behaviour and mechanical properties of PLL/HA multilayer films studied by AFM

  1. Cagri Üzüm,
  2. Johannes Hellwig,
  3. Narayanan Madaboosi,
  4. Dmitry Volodkin and
  5. Regine von Klitzing
  • Full Research Paper
  • Published 21 Nov 2012

  • PDF

Beilstein J. Nanotechnol. 2012, 3, 778–788, doi:10.3762/bjnano.3.87

Spring constant of a tuning-fork sensor for dynamic force microscopy

  1. Dennis van Vörden,
  2. Manfred Lange,
  3. Merlin Schmuck,
  4. Nico Schmidt and
  5. Rolf Möller
  • Full Research Paper
  • Published 29 Nov 2012

  • PDF

Beilstein J. Nanotechnol. 2012, 3, 809–816, doi:10.3762/bjnano.3.90

Pinch-off mechanism in double-lateral-gate junctionless transistors fabricated by scanning probe microscope based lithography

  1. Farhad Larki,
  2. Arash Dehzangi,
  3. Alam Abedini,
  4. Ahmad Makarimi Abdullah,
  5. Elias Saion,
  6. Sabar D. Hutagalung,
  7. Mohd N. Hamidon and
  8. Jumiah Hassan
  • Full Research Paper
  • Published 03 Dec 2012

  • PDF

Beilstein J. Nanotechnol. 2012, 3, 817–823, doi:10.3762/bjnano.3.91

  • Full Research Paper
  • Published 05 Dec 2012

  • PDF

Beilstein J. Nanotechnol. 2012, 3, 824–830, doi:10.3762/bjnano.3.92

Characterization of the mechanical properties of qPlus sensors

  1. Jan Berger,
  2. Martin Švec,
  3. Martin Müller,
  4. Martin Ledinský,
  5. Antonín Fejfar,
  6. Pavel Jelínek and
  7. Zsolt Majzik
  • Full Research Paper
  • Published 02 Jan 2013

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Beilstein J. Nanotechnol. 2013, 4, 1–9, doi:10.3762/bjnano.4.1

  • Full Research Paper
  • Published 08 Jan 2013

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  • Supp. Info

Beilstein J. Nanotechnol. 2013, 4, 10–19, doi:10.3762/bjnano.4.2

Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

  1. Jannis Lübbe,
  2. Matthias Temmen,
  3. Sebastian Rode,
  4. Philipp Rahe,
  5. Angelika Kühnle and
  6. Michael Reichling
  • Full Research Paper
  • Published 17 Jan 2013

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2013, 4, 32–44, doi:10.3762/bjnano.4.4

Interpreting motion and force for narrow-band intermodulation atomic force microscopy

  1. Daniel Platz,
  2. Daniel Forchheimer,
  3. Erik A. Tholén and
  4. David B. Haviland
  • Full Research Paper
  • Published 21 Jan 2013

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Beilstein J. Nanotechnol. 2013, 4, 45–56, doi:10.3762/bjnano.4.5

  • Full Research Paper
  • Published 07 Feb 2013

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Beilstein J. Nanotechnol. 2013, 4, 87–93, doi:10.3762/bjnano.4.10

High-resolution dynamic atomic force microscopy in liquids with different feedback architectures

  1. John Melcher,
  2. David Martínez-Martín,
  3. Miriam Jaafar,
  4. Julio Gómez-Herrero and
  5. Arvind Raman
  • Full Research Paper
  • Published 27 Feb 2013

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Beilstein J. Nanotechnol. 2013, 4, 153–163, doi:10.3762/bjnano.4.15

  • Full Research Paper
  • Published 18 Mar 2013

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Beilstein J. Nanotechnol. 2013, 4, 198–207, doi:10.3762/bjnano.4.20

  • Full Research Paper
  • Published 25 Mar 2013

  • PDF

Beilstein J. Nanotechnol. 2013, 4, 218–226, doi:10.3762/bjnano.4.22

Determining cantilever stiffness from thermal noise

  1. Jannis Lübbe,
  2. Matthias Temmen,
  3. Philipp Rahe,
  4. Angelika Kühnle and
  5. Michael Reichling
  • Full Research Paper
  • Published 28 Mar 2013

  • PDF

Beilstein J. Nanotechnol. 2013, 4, 227–233, doi:10.3762/bjnano.4.23

  • Full Research Paper
  • Published 05 Apr 2013

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Beilstein J. Nanotechnol. 2013, 4, 243–248, doi:10.3762/bjnano.4.25

Polynomial force approximations and multifrequency atomic force microscopy

  1. Daniel Platz,
  2. Daniel Forchheimer,
  3. Erik A. Tholén and
  4. David B. Haviland
  • Full Research Paper
  • Published 10 Jun 2013

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2013, 4, 352–360, doi:10.3762/bjnano.4.41

  • Full Research Paper
  • Published 17 Jun 2013

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2013, 4, 370–376, doi:10.3762/bjnano.4.43

  • Full Research Paper
  • Published 21 Jun 2013

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2013, 4, 385–393, doi:10.3762/bjnano.4.45

Ni nanocrystals on HOPG(0001): A scanning tunnelling microscope study

  1. Michael Marz,
  2. Keisuke Sagisaka and
  3. Daisuke Fujita
  • Full Research Paper
  • Published 28 Jun 2013

  • PDF

Beilstein J. Nanotechnol. 2013, 4, 406–417, doi:10.3762/bjnano.4.48

Kelvin probe force microscopy of nanocrystalline TiO2 photoelectrodes

  1. Alex Henning,
  2. Gino Günzburger,
  3. Res Jöhr,
  4. Yossi Rosenwaks,
  5. Biljana Bozic-Weber,
  6. Catherine E. Housecroft,
  7. Edwin C. Constable,
  8. Ernst Meyer and
  9. Thilo Glatzel
  • Full Research Paper
  • Published 01 Jul 2013

  • PDF

Beilstein J. Nanotechnol. 2013, 4, 418–428, doi:10.3762/bjnano.4.49

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