Advanced atomic force microscopy techniques III

  1. editorImage
  1. Editor: Dr. Thilo Glatzel
    University of Basel

Atomic force microscopy is the standard tool for nanometer-scale imaging of all types of surfaces in all environments. The third volume of the Thematic Series “Advanced atomic force microscopy techniques”, which is presented here, compiles again exciting developments in nanoscale research. The second volume was edited by Thilo Glatzel and Thomas Schimmel, the first volume by Thilo Glatzel and Udo D. Schwarz.

See also the Thematic Series:
Advanced atomic force microscopy techniques IV

Noncontact atomic force microscopy III

Advanced atomic force microscopy techniques III

  1. Thilo Glatzel and
  2. Thomas Schimmel
  • Editorial
  • Published 21 Jul 2016

Beilstein J. Nanotechnol. 2016, 7, 1052–1054, doi:10.3762/bjnano.7.98

Modification of a single-molecule AFM probe with highly defined surface functionality

  1. Fei Long,
  2. Bin Cao,
  3. Ashok Khanal,
  4. Shiyue Fang and
  5. Reza Shahbazian-Yassar
  • Full Research Paper
  • Published 14 Nov 2014

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2014, 5, 2122–2128, doi:10.3762/bjnano.5.221

  • Full Research Paper
  • Published 18 Nov 2014

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2014, 5, 2149–2163, doi:10.3762/bjnano.5.224

High-frequency multimodal atomic force microscopy

  1. Adrian P. Nievergelt,
  2. Jonathan D. Adams,
  3. Pascal D. Odermatt and
  4. Georg E. Fantner
  • Full Research Paper
  • Published 22 Dec 2014

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Beilstein J. Nanotechnol. 2014, 5, 2459–2467, doi:10.3762/bjnano.5.255

  • Letter
  • Published 13 Jan 2015

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  • Supp. Info

Beilstein J. Nanotechnol. 2015, 6, 149–156, doi:10.3762/bjnano.6.14

Increasing throughput of AFM-based single cell adhesion measurements through multisubstrate surfaces

  1. Miao Yu,
  2. Nico Strohmeyer,
  3. Jinghe Wang,
  4. Daniel J. Müller and
  5. Jonne Helenius
  • Full Research Paper
  • Published 14 Jan 2015

  • PDF

Beilstein J. Nanotechnol. 2015, 6, 157–166, doi:10.3762/bjnano.6.15

Kelvin probe force microscopy in liquid using electrochemical force microscopy

  1. Liam Collins,
  2. Stephen Jesse,
  3. Jason I. Kilpatrick,
  4. Alexander Tselev,
  5. M. Baris Okatan,
  6. Sergei V. Kalinin and
  7. Brian J. Rodriguez
  • Full Research Paper
  • Published 19 Jan 2015

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  • Supp. Info

Beilstein J. Nanotechnol. 2015, 6, 201–214, doi:10.3762/bjnano.6.19

  • Full Research Paper
  • Published 04 Feb 2015

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Beilstein J. Nanotechnol. 2015, 6, 369–379, doi:10.3762/bjnano.6.36

  • Full Research Paper
  • Published 10 Feb 2015

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Beilstein J. Nanotechnol. 2015, 6, 420–427, doi:10.3762/bjnano.6.42

Mapping of elasticity and damping in an α + β titanium alloy through atomic force acoustic microscopy

  1. M. Kalyan Phani,
  2. Anish Kumar,
  3. T. Jayakumar,
  4. Walter Arnold and
  5. Konrad Samwer
  • Full Research Paper
  • Published 18 Mar 2015

  • PDF

Beilstein J. Nanotechnol. 2015, 6, 767–776, doi:10.3762/bjnano.6.79

  • Full Research Paper
  • Published 25 Mar 2015

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2015, 6, 809–819, doi:10.3762/bjnano.6.84

Stick–slip behaviour on Au(111) with adsorption of copper and sulfate

  1. Nikolay Podgaynyy,
  2. Sabine Wezisla,
  3. Christoph Molls,
  4. Shahid Iqbal and
  5. Helmut Baltruschat
  • Full Research Paper
  • Published 26 Mar 2015

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Beilstein J. Nanotechnol. 2015, 6, 820–830, doi:10.3762/bjnano.6.85

  • Full Research Paper
  • Published 30 Mar 2015

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Beilstein J. Nanotechnol. 2015, 6, 845–856, doi:10.3762/bjnano.6.87

Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

  1. Mykola Telychko,
  2. Jan Berger,
  3. Zsolt Majzik,
  4. Pavel Jelínek and
  5. Martin Švec
  • Full Research Paper
  • Published 07 Apr 2015

  • PDF

Beilstein J. Nanotechnol. 2015, 6, 901–906, doi:10.3762/bjnano.6.93

  • Full Research Paper
  • Published 14 Apr 2015

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  • Supp. Info

Beilstein J. Nanotechnol. 2015, 6, 952–963, doi:10.3762/bjnano.6.98

Optimization of phase contrast in bimodal amplitude modulation AFM

  1. Mehrnoosh Damircheli,
  2. Amir F. Payam and
  3. Ricardo Garcia
  • Full Research Paper
  • Published 28 Apr 2015

  • PDF

Beilstein J. Nanotechnol. 2015, 6, 1072–1081, doi:10.3762/bjnano.6.108

Probing fibronectin–antibody interactions using AFM force spectroscopy and lateral force microscopy

  1. Andrzej J. Kulik,
  2. Małgorzata Lekka,
  3. Kyumin Lee,
  4. Grazyna Pyka-Fościak and
  5. Wieslaw Nowak
  • Full Research Paper
  • Published 15 May 2015

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Beilstein J. Nanotechnol. 2015, 6, 1164–1175, doi:10.3762/bjnano.6.118

Tattoo ink nanoparticles in skin tissue and fibroblasts

  1. Colin A. Grant,
  2. Peter C. Twigg,
  3. Richard Baker and
  4. Desmond J. Tobin
  • Full Research Paper
  • Published 20 May 2015

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Beilstein J. Nanotechnol. 2015, 6, 1183–1191, doi:10.3762/bjnano.6.120

Nano-contact microscopy of supracrystals

  1. Adam Sweetman,
  2. Nicolas Goubet,
  3. Ioannis Lekkas,
  4. Marie Paule Pileni and
  5. Philip Moriarty
  • Full Research Paper
  • Published 29 May 2015

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  • Supp. Info

Beilstein J. Nanotechnol. 2015, 6, 1229–1236, doi:10.3762/bjnano.6.126

Atomic force microscopy as analytical tool to study physico-mechanical properties of intestinal cells

  1. Christa Schimpel,
  2. Oliver Werzer,
  3. Eleonore Fröhlich,
  4. Gerd Leitinger,
  5. Markus Absenger-Novak,
  6. Birgit Teubl,
  7. Andreas Zimmer and
  8. Eva Roblegg
  • Full Research Paper
  • Published 06 Jul 2015

  • PDF

Beilstein J. Nanotechnol. 2015, 6, 1457–1466, doi:10.3762/bjnano.6.151

  • Full Research Paper
  • Published 13 Aug 2015

  • PDF

Beilstein J. Nanotechnol. 2015, 6, 1721–1732, doi:10.3762/bjnano.6.176

A simple method for the determination of qPlus sensor spring constants

  1. John Melcher,
  2. Julian Stirling and
  3. Gordon A. Shaw
  • Full Research Paper
  • Published 14 Aug 2015

  • PDF

Beilstein J. Nanotechnol. 2015, 6, 1733–1742, doi:10.3762/bjnano.6.177

Electrospray deposition of organic molecules on bulk insulator surfaces

  1. Antoine Hinaut,
  2. Rémy Pawlak,
  3. Ernst Meyer and
  4. Thilo Glatzel
  • Full Research Paper
  • Published 18 Sep 2015

  • PDF

Beilstein J. Nanotechnol. 2015, 6, 1927–1934, doi:10.3762/bjnano.6.195

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