Advanced atomic force microscopy

  1. editorImage
  1. Editors: Dr. Thilo Glatzel, University of Basel, Prof. Mehmet Z. Baykara, Bilkent University, Prof. Udo D. Schwarz, Yale University and Prof. Ricardo Garcia, Instituto de Ciencia de Materiales de Madrid

This Thematic Series presents the latest research results in advanced atomic force microscopy.

Further articles will be published during the next weeks.

  • Full Research Paper
  • Published 06 Feb 2017

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Beilstein J. Nanotechnol. 2017, 8, 358–371, doi:10.3762/bjnano.8.38

  • Full Research Paper
  • Published 08 Mar 2017

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  • Supp. Info

Beilstein J. Nanotechnol. 2017, 8, 579–589, doi:10.3762/bjnano.8.62

  • Full Research Paper
  • Published 20 Mar 2017

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Beilstein J. Nanotechnol. 2017, 8, 657–666, doi:10.3762/bjnano.8.70

Calculating free energies of organic molecules on insulating substrates

  1. Julian Gaberle,
  2. David Z. Gao and
  3. Alexander L. Shluger
  • Full Research Paper
  • Published 21 Mar 2017

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Beilstein J. Nanotechnol. 2017, 8, 667–674, doi:10.3762/bjnano.8.71

  • Full Research Paper
  • Published 10 Apr 2017

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Beilstein J. Nanotechnol. 2017, 8, 813–825, doi:10.3762/bjnano.8.84

Functional dependence of resonant harmonics on nanomechanical parameters in dynamic mode atomic force microscopy

  1. Federico Gramazio,
  2. Matteo Lorenzoni,
  3. Francesc Pérez-Murano,
  4. Enrique Rull Trinidad,
  5. Urs Staufer and
  6. Jordi Fraxedas
  • Full Research Paper
  • Published 19 Apr 2017

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  • Supp. Info

Beilstein J. Nanotechnol. 2017, 8, 883–891, doi:10.3762/bjnano.8.90

  • Full Research Paper
  • Published 02 May 2017

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Beilstein J. Nanotechnol. 2017, 8, 968–974, doi:10.3762/bjnano.8.98

A review of demodulation techniques for amplitude-modulation atomic force microscopy

  1. Michael G. Ruppert,
  2. David M. Harcombe,
  3. Michael R. P. Ragazzon,
  4. S. O. Reza Moheimani and
  5. Andrew J. Fleming
  • Review
  • Published 10 Jul 2017

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Beilstein J. Nanotechnol. 2017, 8, 1407–1426, doi:10.3762/bjnano.8.142

  • Full Research Paper
  • Published 02 Aug 2017

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Beilstein J. Nanotechnol. 2017, 8, 1563–1570, doi:10.3762/bjnano.8.158

Air–water interface of submerged superhydrophobic surfaces imaged by atomic force microscopy

  1. Markus Moosmann,
  2. Thomas Schimmel,
  3. Wilhelm Barthlott and
  4. Matthias Mail
  • Full Research Paper
  • Published 11 Aug 2017

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  • Supp. Info

Beilstein J. Nanotechnol. 2017, 8, 1671–1679, doi:10.3762/bjnano.8.167

Evaluation of preparation methods for suspended nano-objects on substrates for dimensional measurements by atomic force microscopy

  1. Petra Fiala,
  2. Daniel Göhler,
  3. Benno Wessely,
  4. Michael Stintz,
  5. Giovanni Mattia Lazzerini and
  6. Andrew Yacoot
  • Full Research Paper
  • Published 28 Aug 2017

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Beilstein J. Nanotechnol. 2017, 8, 1774–1785, doi:10.3762/bjnano.8.179

  • Full Research Paper
  • Published 04 Oct 2017

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  • Supp. Info

Beilstein J. Nanotechnol. 2017, 8, 2069–2082, doi:10.3762/bjnano.8.207

  • Full Research Paper
  • Published 26 Oct 2017

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  • Supp. Info

Beilstein J. Nanotechnol. 2017, 8, 2230–2244, doi:10.3762/bjnano.8.223

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