Advanced atomic force microscopy techniques IV

  1. editorImage
  1. Editor: Dr. Thilo Glatzel
    University of Basel

This Thematic Series presents the latest research results in atomic force microscopy.

Further articles will be published during the next weeks.

Distribution of Pd clusters on ultrathin, epitaxial TiOx films on Pt3Ti(111)

  1. Christian Breinlich,
  2. Maria Buchholz,
  3. Marco Moors,
  4. Tobias Pertram,
  5. Conrad Becker and
  6. Klaus Wandelt
  • Full Research Paper
  • Published 09 Oct 2015

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Beilstein J. Nanotechnol. 2015, 6, 2007–2014, doi:10.3762/bjnano.6.204

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

  1. Tino Wagner,
  2. Hannes Beyer,
  3. Patrick Reissner,
  4. Philipp Mensch,
  5. Heike Riel,
  6. Bernd Gotsmann and
  7. Andreas Stemmer
  • Full Research Paper
  • Published 23 Nov 2015

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2015, 6, 2193–2206, doi:10.3762/bjnano.6.225

  • Full Research Paper
  • Published 24 Feb 2016

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Beilstein J. Nanotechnol. 2016, 7, 284–295, doi:10.3762/bjnano.7.26

  • Full Research Paper
  • Published 30 Mar 2016

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  • Supp. Info

Beilstein J. Nanotechnol. 2016, 7, 492–500, doi:10.3762/bjnano.7.43

  • Full Research Paper
  • Published 15 Apr 2016

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  • Supp. Info

Beilstein J. Nanotechnol. 2016, 7, 554–571, doi:10.3762/bjnano.7.49

Characterization of spherical domains at the polystyrene thin film–water interface

  1. Khurshid Ahmad,
  2. Xuezeng Zhao,
  3. Yunlu Pan and
  4. Danish Hussain
  • Full Research Paper
  • Published 20 Apr 2016

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  • Supp. Info

Beilstein J. Nanotechnol. 2016, 7, 581–590, doi:10.3762/bjnano.7.51

  • Full Research Paper
  • Published 22 Apr 2016

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Beilstein J. Nanotechnol. 2016, 7, 605–612, doi:10.3762/bjnano.7.53

Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers

  1. Christian Ganser,
  2. Gerhard Fritz-Popovski,
  3. Roland Morak,
  4. Parvin Sharifi,
  5. Benedetta Marmiroli,
  6. Barbara Sartori,
  7. Heinz Amenitsch,
  8. Thomas Griesser,
  9. Christian Teichert and
  10. Oskar Paris
  • Full Research Paper
  • Published 28 Apr 2016

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Beilstein J. Nanotechnol. 2016, 7, 637–644, doi:10.3762/bjnano.7.56

  • Full Research Paper
  • Published 17 May 2016

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Beilstein J. Nanotechnol. 2016, 7, 708–720, doi:10.3762/bjnano.7.63

High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads

  1. Benjamin Grévin,
  2. Pierre-Olivier Schwartz,
  3. Laure Biniek,
  4. Martin Brinkmann,
  5. Nicolas Leclerc,
  6. Elena Zaborova and
  7. Stéphane Méry
  • Full Research Paper
  • Published 03 Jun 2016

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  • Supp. Info

Beilstein J. Nanotechnol. 2016, 7, 799–808, doi:10.3762/bjnano.7.71

Understanding interferometry for micro-cantilever displacement detection

  1. Alexander von Schmidsfeld,
  2. Tobias Nörenberg,
  3. Matthias Temmen and
  4. Michael Reichling
  • Full Research Paper
  • Published 10 Jun 2016

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  • Supp. Info

Beilstein J. Nanotechnol. 2016, 7, 841–851, doi:10.3762/bjnano.7.76

Generalized Hertz model for bimodal nanomechanical mapping

  1. Aleksander Labuda,
  2. Marta Kocuń,
  3. Waiman Meinhold,
  4. Deron Walters and
  5. Roger Proksch
  • Full Research Paper
  • Published 05 Jul 2016

  • PDF

Beilstein J. Nanotechnol. 2016, 7, 970–982, doi:10.3762/bjnano.7.89

Signal enhancement in cantilever magnetometry based on a co-resonantly coupled sensor

  1. Julia Körner,
  2. Christopher F. Reiche,
  3. Thomas Gemming,
  4. Bernd Büchner,
  5. Gerald Gerlach and
  6. Thomas Mühl
  • Full Research Paper
  • Published 18 Jul 2016

  • PDF

Beilstein J. Nanotechnol. 2016, 7, 1033–1043, doi:10.3762/bjnano.7.96

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