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Cite the Following Article
Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere
Petr Knotek, Tomáš Plecháček, Jan Smolík, Petr Kutálek, Filip Dvořák, Milan Vlček, Jiří Navrátil and Čestmír Drašar
Beilstein J. Nanotechnol. 2019, 10, 1401–1411.
https://doi.org/10.3762/bjnano.10.138
How to Cite
Knotek, P.; Plecháček, T.; Smolík, J.; Kutálek, P.; Dvořák, F.; Vlček, M.; Navrátil, J.; Drašar, Č. Beilstein J. Nanotechnol. 2019, 10, 1401–1411. doi:10.3762/bjnano.10.138
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