- Full Research Paper
- Published 24 Nov 2020
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Figure 1: Transmission electron microscopy (TEM) image of a layered nanostructure consisting of Nb, CuNi, CoOx...
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Figure 2: High-resolution transmission electron microscopy (HR-TEM) image of a layered Co, CoOx and CuNi nano...
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Figure 3: Sketch of a Nb/Co spin-valve nanosystem. The numbers next to the elements in the layers represent t...
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Figure 4: Scheme of the multilayer nanosystem formation modeling processes. The nanosystem contains a materia...
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Figure 5: Multilayer nanosystem of niobium and cobalt. The contact points of the nanofilms are indicated by (...
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Figure 6: Change in coordination (CN) number along the z-axis (shown in Figure 5) in Nb and Co layers of the nanostru...
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Figure 7: Spatial distribution of the coordination number in the formed multilayer Nb–Co (a) system and in it...
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Figure 8: The area of deposition flow (a) and the size of the simulation area (b). The deposition flow area i...
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Figure 9: Relative layer-by-layer composition of the Nb–Co nanosystem when the deposition flux is reduced by ...
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Figure 10: The relative layered composition of the Nb–Co nanosystem for different deposition rates. The parame...
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Figure 11: The percentage composition of the Nb–Co multilayer nanosystem formed at a substrate temperature of ...
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- Full Research Paper
- Published 23 Nov 2020
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Figure 1: sMIM setup showing the detection of the sMIM-C (ε) and sMIM-R (σ) signals. VAC and VDC are applied ...
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Figure 2: Topography of the cross section of the PIN diode. The scanned area is 83 µm × 54 µm. Deep trenches ...
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Figure 3: sMIM results for a 25 µm × 25 µm area at the PIN anode area (area 1 in Figure 2). (a) ∂C/∂V phase, (b) ∂C/∂V...
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Figure 4: sMIM-C profiles along the central axis of the diode structure. A single line scan (blue) and the av...
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Figure 5: Depth profiles (∂C/∂V phase, ∂C/∂V amplitude, sMIM-R, and sMIM-C) along the PIN structure compared ...
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Figure 6: sMIM acquisitions of the bottom of the deep trench structure. (a) ∂C/∂V phase (10 µm × 10 µm), (b) ∂...
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Figure 7: sMIM maps acquired at VDC = 0 V on a large area (83 µm × 54 µm) of the PIN diode device. (a) ∂C/∂V ...
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Figure 8: Analytic calculations of the equivalent capacitance CNano determined for the tip–sample contact as ...
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Figure 9: Force curve as a function of time during the dynamic spectroscopy sMIM measurement. 1: tip approach...
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Figure 10: sMIM-C DCUBE slices (55 µm × 33 µm) obtained for various VDC values (the bias is applied to the sam...
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- Full Research Paper
- Published 20 Nov 2020
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Figure 1: Transmission spectra T = f(λ) of separate amorphous thin films and multilayer HS (1: Ge0.30As0.04S0...
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Figure 2: Absorption spectra α = f(hν) of separate amorphous thin films and multilayer HS (1: Ge0.30As0.04S0....
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Figure 3: Current–voltage characteristics of the amorphous thin-film HS with a positive voltage applied to th...
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Figure 4: Current–voltage characteristics of the amorphous thin-film HS with a negative voltage applied to th...
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Figure 5: Photocurrent spectra of separate amorphous thin films and the multilayer HS with a positive voltage...
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Figure 6: Photocurrent spectra of separate amorphous thin films and the HS with a negative voltage applied to...
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Figure 7: Normalized photocurrent spectra of the multilayer HS with different positive values of the voltage ...
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Figure 8: Normalized photocurrent spectra of the multilayer HS with different negative values of the voltage ...
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Figure 9: Peak position in the spectral distribution of the photocurrent for the different thin-film structur...
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Figure 10: Peak position in the spectral distribution of the photocurrent of amorphous thin-film HS as a funct...
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Figure 11: The magnifying power K of the different thin-film structures at positive (1) and at negative (2) po...
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Figure 12: The magnifying power K of the amorphous thin-film HS as a function of the applied voltage with posi...
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- Letter
- Published 19 Nov 2020
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Figure 1: AFM image (100 × 80 nm2) of the 16×2 reconstruction on Si(110). Solid and dotted rectangles represe...
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Figure 2: (a) Atomic-resolution AFM image (8 × 8 nm2) of the 16×2 reconstruction area shown in Figure 1 (f0 = 162.5 k...
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Figure 3: (a) An AFM image (7 × 6 nm2) of the 16×2 reconstruction surface with protrusions on L-P3 sites. Whi...
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Figure 4: (a) An AFM image of the 16×2 reconstruction with the atomic lattice of the unreconstructed surface ...
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Figure 5: Models of phase relationships between pentagons on the upper terrace (green) and those on the lower...
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- Full Research Paper
- Published 18 Nov 2020
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Figure 1: Comparison of the spot size (imaging resolution) as a function of the ion beam current for differen...
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Figure 2: Mass spectrum of a Ga33Bi57Li10 LMAIS at an acceleration potential of 10 kV scanned by the ExB volt...
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Figure 3: Examples using different ions: a) 30 keV He+, field of view (FOV): 1.5 × 1.5 µm2, trench width: 4 n...
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Figure 4: Summary of the imaging resolution (80/20), experimentally achieved trench width, and simulated mini...
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Figure 5: SRIM simulation [39] of the sputter profile from a 30 keV point-like beam in a gold substrate as a func...
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Figure 6: Comparison of the normalized ion beam profiles (normalized half profiles = beam radius) obtained fr...
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- Full Research Paper
- Published 13 Nov 2020
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Figure 1: Schematic representation of CNTs-PEG-PEI nanocarriers and the drug-loading process.
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Figure 2: TEM images of (A) raw SWCNTs, (B–D) CNTs-COOH synthesized using different acid solutions: (B) H2SO4...
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Figure 3: TEM images of (A) raw SWCNTs, (B–D) CNTs-COOH synthesized using different acid solutions: (B) H2SO4...
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Figure 4: Characterization of different nanocarriers. (A, B) XPS spectra, (C) FTIR spectra, (D) XRD diffracti...
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Figure 5: AFM images of (A) raw SWCNTs, (B) CNTs-COOH, (C) CNTs-PEG, and (D) CNTs-PEG-PEI.
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Figure 6: Cumulative release profiles of DOX from different nanocarriers in PBS at (A) pH 7.4 and (B) pH 5.0 (...
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Figure 7: Cytotoxicity of (A) different blank carriers and (B) DOX-loaded formulations against MCF-7 cells af...
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Figure 8: (A) Fluorescence images of MCF-7 cells after treatment with free DOX (control) and different DOX-lo...
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Figure 9: (A) Confocal microscopy images of MCF-7 cells after treatment with free DOX (control) and different...
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Figure 10: Effects of free DOX, different DOX-loaded nanocarrier formulations, and blank carriers on apoptosis...
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- Full Research Paper
- Published 12 Nov 2020
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Figure 1: The function D without approximations (Equation 2) and with both approximations (Equation 4 and Equation 5) for γ = 0.97. The top...
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Figure 2: The function α without approximations (Equation 1) and its three approximations αc (Equation 8), αt (Equation 10), and αξ (Equation 12). The ...
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Figure 3: Error ΔEtot engendered by an uncertainty Δfn/fn0 = 1%, calculated from Equation 20 with γ = 0.97, F = 100 nN, R...
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Figure 4: Tapping-mode topography image of a 100 nm thick PnBMA film after a smaller area (15 µm)2 was scanne...
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Figure 5: CR frequency f(t) in the first mode as a function of the measuring time on three PnBMA films with t...
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Figure 6: CR frequencies as a function of the force F on glass (diamonds), bulk PMMA (triangles), and bulk PS...
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Figure 7: CR frequency as a function of the force F on glass (diamonds), bulk PMMA (white triangles), and bul...
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Figure 8: Normalized contact stiffness α on glass (white diamonds, calculated with γ = 0.982, and grey diamon...
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Figure 9: CR frequency as a function of the normalized contact stiffness αH = ks,H/kc on glass (open and full...
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- Full Research Paper
- Published 11 Nov 2020
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Figure 1: (Left) Schematics of the fabrication process and (right) SEM images of silicon nanowire forests. Th...
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Figure 2: Left: sketch of the measurement apparatus. Right: thermal resistance of several samples as a functi...
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Figure 3: Measured voltage drop (Seebeck voltage ΔVseebeck) as a function of the temperature difference betwe...
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Figure 4: Numerical simulations of phosphorous diffusion in silicon nanowires. The doping concentration is ma...
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- Full Research Paper
- Published 06 Nov 2020
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Figure 1: (a) AFM image and (b) the corresponding depth profile of a fragment of the surface depression produ...
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Figure 2: Fluence dependence on the irradiation-induced surface depthening for a 5 nm Pt60Pd40/200 nm PMMA sa...
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Figure 3: Helium ion microscopy (HIM) images of a 5 nm Pt60Pd40/200 nm PMMA sample irradiated at a fluence of...
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Figure 4: (a) Optical micrograph of an array of squares produced with He+/25 keV FIB in a 15 nm Au/200 nm PMM...
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Figure 5: (a) AFM image and the corresponding depth profile of a part of the surface depression produced in a...
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Figure 6: Fluence dependence of the irradiation-induced depth for the Pt60Pd40/PC sample (red circles). For c...
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Figure 7: HIM images of square (a) and circular (b) arrays produced in 15 nm Pt60Pd40/PDMS samples by irradia...
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Figure 8: Fluence dependence of the irradiation-induced depth for a 15 nm Pt60Pd40/PDMS sample irradiated wit...
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