Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

Wenting Wang, Chengfu Ma, Yuhang Chen, Lei Zheng, Huarong Liu and Jiaru Chu
Beilstein J. Nanotechnol. 2019, 10, 1636–1647. https://doi.org/10.3762/bjnano.10.159

Cite the Following Article

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy
Wenting Wang, Chengfu Ma, Yuhang Chen, Lei Zheng, Huarong Liu and Jiaru Chu
Beilstein J. Nanotechnol. 2019, 10, 1636–1647. https://doi.org/10.3762/bjnano.10.159

How to Cite

Wang, W.; Ma, C.; Chen, Y.; Zheng, L.; Liu, H.; Chu, J. Beilstein J. Nanotechnol. 2019, 10, 1636–1647. doi:10.3762/bjnano.10.159

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